High-speed AFM for scanning the architecture of living cells†
Abstract
We address the modelling of tip–cell membrane interactions under high speed
- This article is part of the themed collection: 10th Anniversary of NCNST, China
* Corresponding authors
a
National Center for Nanoscience and Technology, Beijing 100190, People's Republic of China
E-mail:
dhan@nanoctr.cn
Fax: +86 010 62656765
Tel: +86 010 82545568
b
Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing 100190, People's Republic of China
E-mail:
lihan@mail.iee.ac.cn
We address the modelling of tip–cell membrane interactions under high speed
J. Li, Z. Deng, D. Chen, Z. Ao, Q. Sun, J. Feng, B. Yin, L. Han and D. Han, Nanoscale, 2013, 5, 8355 DOI: 10.1039/C3NR01464A
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