Issue 16, 2022

Advanced scanning electron microscopy techniques for structural characterization of zeolites

Abstract

In this work, low-voltage field emission scanning electron microscopy (FE-SEM) and energy dispersive X-ray spectroscopy (EDS) analyses were applied for the investigation of zeolite structures. Low-voltage electron imaging was applied to visualize the surface structures of ZSM-5 zeolites with a mosaic surface morphology, and cross-sectional imaging techniques were used to show the sub-surface etching of SAPO-34 zeolites that cannot otherwise be directly revealed by SEM. In the case of SAPO-34 zeo-type crystals, the hidden macropores with a framed butterfly shape introduced by NH4F etching were revealed. In addition, the combined low-voltage imaging and EDS triple-detector analysis allowed recording of the near-surface-layer element distribution in the zeolite crystals; this was exemplified on SAPO-34 crystals during dissolution for the first time. The results showed that some inner parts of the SAPO-34 crystals are more vulnerable than the outermost shell of the crystals, which were preferentially removed during the NH4F etching.

Graphical abstract: Advanced scanning electron microscopy techniques for structural characterization of zeolites

Supplementary files

Article information

Article type
Research Article
Submitted
30 ဧပြီ 2022
Accepted
25 ဇွန် 2022
First published
07 ဇူ 2022

Inorg. Chem. Front., 2022,9, 4225-4231

Advanced scanning electron microscopy techniques for structural characterization of zeolites

N. Asano, S. Asahina, J. Lu, J. Xu, Y. Shen, Z. Qin and S. Mintova, Inorg. Chem. Front., 2022, 9, 4225 DOI: 10.1039/D2QI00952H

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