Issue 9, 2023

Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique

Abstract

A hybrid technique combining atomic force microscopy and the fixed-junction technique is developed to simultaneously probe the electrical and mechanical characteristics of a single-molecule junction.

Graphical abstract: Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique

Supplementary files

Article information

Article type
Communication
Submitted
31 Okt. 2022
Accepted
28 Dec. 2022
First published
12 Janv. 2023

Nanoscale, 2023,15, 4277-4281

Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique

L. Yu, M. Zhang, H. Chen, B. Xiao and S. Chang, Nanoscale, 2023, 15, 4277 DOI: 10.1039/D2NR06074D

To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.

If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.

If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.

Read more about how to correctly acknowledge RSC content.

Social activity

Spotlight

Advertisements