Issue 22, 2021

Advanced XPS characterization: XPS-based multi-technique analyses for comprehensive understanding of functional materials

Abstract

X-ray photoelectron spectroscopy (XPS) has achieved maturity as an analytical technique in that it is a ubiquitous tool in the materials community, however as made apparent by recent reviews highlighting it's misuse as a means of chemical deduction, it is a practice which is greatly misunderstood even in its simplest form. Advanced XPS techniques, or a combination of XPS and a complementary surficial probe may elicit auxiliary information outside of the scope of the standard sphere of appreciation. This review aims to bring to the attention of the general materials audience a landscape of some atypical applications of lab-based XPS and combinatorial approaches of related surface analysis, such as ion scattering, ultraviolet photoelectron, electron energy loss and auger emission spectroscopies found on many lab-based instrument set-ups.

Graphical abstract: Advanced XPS characterization: XPS-based multi-technique analyses for comprehensive understanding of functional materials

Article information

Article type
Review Article
Submitted
23 Jūl. 2021
Accepted
22 Sept. 2021
First published
23 Sept. 2021
This article is Open Access
Creative Commons BY license

Mater. Chem. Front., 2021,5, 7931-7963

Advanced XPS characterization: XPS-based multi-technique analyses for comprehensive understanding of functional materials

M. A. Isaacs, J. Davies-Jones, P. R. Davies, S. Guan, R. Lee, D. J. Morgan and R. Palgrave, Mater. Chem. Front., 2021, 5, 7931 DOI: 10.1039/D1QM00969A

This article is licensed under a Creative Commons Attribution 3.0 Unported Licence. You can use material from this article in other publications without requesting further permissions from the RSC, provided that the correct acknowledgement is given.

Read more about how to correctly acknowledge RSC content.

Social activity

Spotlight

Advertisements