Issue 39, 2017

Polarization-manipulated all-optical cross-wavelength data inversion in a C-rich SiCx micro-ring

Abstract

With the use of a two-photon-absorption-free C-rich SiCx ring waveguide, the polarization-manipulated all-optical format inversion of a 12.5 Gbit s−1 pulsed return-to-zero on-off-keying (PRZ-OOK) data stream is demonstrated through the nonlinear Kerr switching-induced wavelength conversion process. The nonlinear refractive index of low-temperature plasma-enhanced chemical vapor deposition (PECVD)-synthesized C-rich SiCx is 1.37 × 10−12 cm2 W−1. The TE- and TM-mode polarization-dependent transmission spectrum of a C-rich SiCx ring waveguide with wavelength-separated spectral notches at an extinction ratio of 7 dB can be manipulated via detuning the orthogonal polarization of the incident pump pulse. Moreover, the modulation depth can be enlarged by more than 3 dB. An all-optical wavelength-converted and inverted PRZ-OOK data stream at 12.5 Gbit s−1 with a corresponding extinction rate (ER) of 7.8 dB, signal-to-noise ratio (SNR) of 8 dB and (bit error rate) BER of 2.85 × 10−10 is obtained, which confirms the functionality of such a C-rich SiCx ring waveguide based on pure Kerr switching for implementing ultrafast data processing in all-optical integrated circuits.

Graphical abstract: Polarization-manipulated all-optical cross-wavelength data inversion in a C-rich SiCx micro-ring

Article information

Article type
Paper
Submitted
26 Jūn. 2017
Accepted
04 Sept. 2017
First published
09 Sept. 2017

J. Mater. Chem. C, 2017,5, 10158-10166

Polarization-manipulated all-optical cross-wavelength data inversion in a C-rich SiCx micro-ring

C. Hsieh, C. Cheng, P. Chen, H. Wang, C. Tsai, Y. Chi and G. Lin, J. Mater. Chem. C, 2017, 5, 10158 DOI: 10.1039/C7TC02854G

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