Multi-modal impedance and X-ray characterization enables simultaneous detection of bulk and interfacial crystallization

Nikolaus Doppelhammer; Daniel Spira; Anjul Rais; Dries Vandenabeele; Wauter Wangermez; Charles McMonagle; Dmitry Chernyshov; Eric Breynaert

doi:10.1039/D5CC03808A

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Multi-modal impedance and X-ray characterization enables simultaneous detection of bulk and interfacial crystallization

Nikolaus Doppelhammer,

*^ab Daniel Spira,

^c Anjul Rais,

^b Dries Vandenabeele,

^b Wauter Wangermez,^b Charles McMonagle,

^d Dmitry Chernyshov

^d and Eric Breynaert

*^ab

Author affiliations

* Corresponding authors

^a NMRCoRe-NMR/X-Ray platform for Convergence Research, KU Leuven, Leuven 3001, Belgium
E-mail: nikolaus.doppelhammer@kuleuven.be, eric.breynaert@kuleuven.be

^b Centre for Surface Chemistry and Catalysis Characterisation and Application Team (COK-KAT), KU Leuven, Leuven 3001, Belgium

^c Institute for Microelectronics and Microsensors, Johannes Kepler University Linz, Linz 4020, Austria

^d Swiss–Norwegian Beamlines at the European Synchrotron Radiation Facility, 38000 Grenoble, France

Abstract

A multi-modal platform enabling simultaneous impedance spectroscopy and X-ray scattering is presented. When applied to zeolite crystallization, four-electrode impedance measurements reliably track bulk crystallization kinetics in agreement with X-ray diffraction, while two-electrode impedance data reveal artefacts from electrode passivation.

This article is part of the themed collection: Chemical Communications HOT articles 2025

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DOI: https://doi.org/10.1039/D5CC03808A
Article type: Communication
Submitted: 07 Jul 2025
Accepted: 15 Aug 2025
First published: 19 Aug 2025
This article is Open Access

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Chem. Commun., 2025, Advance Article

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Multi-modal impedance and X-ray characterization enables simultaneous detection of bulk and interfacial crystallization

N. Doppelhammer, D. Spira, A. Rais, D. Vandenabeele, W. Wangermez, C. McMonagle, D. Chernyshov and E. Breynaert, Chem. Commun., 2025, Advance Article , DOI: 10.1039/D5CC03808A

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Chemical Communications

Multi-modal impedance and X-ray characterization enables simultaneous detection of bulk and interfacial crystallization

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Multi-modal impedance and X-ray characterization enables simultaneous detection of bulk and interfacial crystallization

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