Footprints of scanning probe microscopy on halide perovskites

Abstract

Scanning probe microscopy (SPM) with advanced atomic force microscopy (AFM++) have become pivotal for nanoscale elucidation of the structure, optoelectronic and photovoltaic properties of halide perovskite single crystals and polycrystalline films, both in ex-situ and in-situ conditions. These techniques reveal detailed information about film topography, compositional mapping, charge distribution, near-field electrical behaviors, cation-lattice interactions, ion dynamics, piezoelectric characteristics, mechanical durability, thermal conductivity, and magnetic properties in doped perovskite lattices. This perspective outlines the advancements in SPM techniques that deepen our understanding of the optoelectronic and photovoltaic performance of halide perovskites.