Issue 5, 2024

Physical reservoirs based on MoS2–HZO integrated ferroelectric field-effect transistors for reservoir computing systems

Abstract

Reservoir computing (RC), a variant of recurrent neural networks (RNNs), is well-known for its reduced energy consumption through exclusive focus on training the output weight and its superior performance in handling spatiotemporal information. Implementing these networks in hardware requires devices with superior fading memory behavior. Unlike filament-based two-terminal devices, those relying on ferroelectric switching demonstrate improved voltage reliability, while three-terminal transistors provide additional active control. HfO2-based ferroelectric materials such as Hf0.5Zr0.5O2 (HZO), have garnered attention for their scalability and seamless integration with CMOS technology. This study implements a RC hardware based on MoS2–HZO integrated device structure with enhanced spontaneous polarization field. By adjusting the oxygen vacancy concentration, the devices exhibit consistent responses to both identical and nonidentical voltages, making them suitable for diverse RC applications. The high accuracy of MNIST handwritten digits recognition highlights the rich reservoir states of the traditional RC architecture. Additionally, the impact of masks on RC implementation is assessed, showcasing the device's capability for spatiotemporal signal analysis. This development paves the way for implementing energy-efficient and high-performance computing solutions.

Graphical abstract: Physical reservoirs based on MoS2–HZO integrated ferroelectric field-effect transistors for reservoir computing systems

Supplementary files

Article information

Article type
Communication
Submitted
29 11 2023
Accepted
05 2 2024
First published
11 3 2024

Nanoscale Horiz., 2024,9, 752-763

Physical reservoirs based on MoS2–HZO integrated ferroelectric field-effect transistors for reservoir computing systems

L. Li, H. Xiang, H. Zheng, Y. Chien, N. T. Duong, J. Gao and K. Ang, Nanoscale Horiz., 2024, 9, 752 DOI: 10.1039/D3NH00524K

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