Issue 38, 2024

Efficient all-fluorescence white organic light-emitting diodes with superior color stability and low efficiency roll-off employing matrix-free blue emitting layers

Abstract

All-fluorescence white organic light-emitting diodes (WOLEDs) based on thermally activated delayed fluorescence (TADF) have great potential for large-area light sources. However, designing all-fluorescence WOLEDs that can simultaneously achieve high efficiency, low efficiency roll-off, and excellent color stability with simplified device architectures is still challenging. Herein, we report a simplified three-color all-fluorescence WOLED comprising a matrix-free TADF blue emitting layer (EML) and sensitized EMLs. By broadening exciton distribution and reducing exciton losses through multiple sensitizing processes using an advanced triple-EML configuration, we simultaneously improve the color stability and reduce the efficiency roll-off of DMAC-DPS-based all-fluorescence WOLEDs. Moreover, by introducing a blue emitter Cz-TRZ3 to enhance the charge balance, the all-fluorescence WOLED reaches a maximum external quantum efficiency (EQE) of 24.3% and maintains 22.4% and 19.6% at 100 and 1000 cd m−2, respectively. Remarkably, the device shows extremely color stable electroluminescence spectra with a negligible chromaticity coordinate shift of (0.001, 0.004) in a wide luminance range of 1000–10 000 cd m−2. Our results provide a universal strategy to achieve all-fluorescence WOLEDs with low efficiency roll-off and superior color stability.

Graphical abstract: Efficient all-fluorescence white organic light-emitting diodes with superior color stability and low efficiency roll-off employing matrix-free blue emitting layers

Supplementary files

Article information

Article type
Paper
Submitted
05 ៤ 2024
Accepted
20 ៧ 2024
First published
26 ៧ 2024

J. Mater. Chem. C, 2024,12, 15519-15526

Efficient all-fluorescence white organic light-emitting diodes with superior color stability and low efficiency roll-off employing matrix-free blue emitting layers

Y. Liu, R. Xue, D. Li, Y. Li, Y. Zhang, S. Huang, C. Zhang, Q. Feng, T. Li and L. Cui, J. Mater. Chem. C, 2024, 12, 15519 DOI: 10.1039/D4TC01413H

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