Determination of the sputtering yield of cholesterol using Arn+and C60+(+)cluster ions

P. D. Rakowska, M. P. Seah, J.-L. Vorng, R. Havelund and I. S. Gilmore

Analyst, 2016, 141, 4893
DOI: 10.1039/C6AN00791K

Thin film depth profiling by ion beam analysis

Chris Jeynes and Julien L. Colaux

Analyst, 2016, 141, 5944
DOI: 10.1039/C6AN01167E

Effect of energy per atom (E/n) on the Ar gas cluster ion beam (Ar-GCIB) and O2+ cosputter process

Shin-Kung Wang, Hsun-Yun Chang, Yi-Hsuan Chu, Wei-Lun Kao, Chen-Yi Wu, Yi-Wei Lee, Yun-Wen You, Kuo-Jui Chu, Shu-Hang Hung and Jing-Jong Shyue

Analyst, 2019, 144, 3323
DOI: 10.1039/C8AN02452A

Systematic Temperature Effects in the Argon Cluster Ion Sputter Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry

Martin P. Seah, Rasmus Havelund and Ian S. Gilmore

J. Am. Soc. Mass Spectrom., 2016, 27, 1411
DOI: 10.1007/s13361-016-1401-5

Comparing sputter rates, depth resolution, and ion yields for different gas cluster ion beams (GCIB): A practical guide to choosing the best GCIB for every application

N. Sano, A. Bellew and P. Blenkinsopp

Journal of Vacuum Science & Technology A, 2023, 41
DOI: 10.1116/6.0002864

Characterization of polymeric surfaces and interfaces using time‐of‐flight secondary ion mass spectrometry

Hao Mei, Travis S. Laws, Tanguy Terlier, Rafael Verduzco and Gila E. Stein

Journal of Polymer Science, 2022, 60, 1174
DOI: 10.1002/pol.20210282

Validated Analysis of Component Distribution Inside Perovskite Solar Cells and Its Utility in Unveiling Factors of Device Performance and Degradation

Cheng-Hung Hou, Shu-Han Hung, Li-Ji Jhang, Keh-Jiunh Chou, Yu-Kai Hu, Pi-Tai Chou, Wei-Fang Su, Feng-Yu Tsai, Jay Shieh and Jing-Jong Shyue

ACS Appl. Mater. Interfaces, 2020, 12, 22730
DOI: 10.1021/acsami.9b22492

Systematic compositional analysis of sputter-deposited boron-containing thin films

Babak Bakhit, Daniel Primetzhofer, Eduardo Pitthan, Mauricio A. Sortica, Eleni Ntemou, Johanna Rosen, Lars Hultman, Ivan Petrov and Grzegorz Greczynski

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2021, 39
DOI: 10.1116/6.0001234

Sampling Depths, Depth Shifts, and Depth Resolutions for Bin+ Ion Analysis in Argon Gas Cluster Depth Profiles

R. Havelund, M. P. Seah and I. S. Gilmore

J. Phys. Chem. B, 2016, 120, 2604
DOI: 10.1021/acs.jpcb.5b12697

SIMS of Delta Layers in Organic Materials: Amount of Substance, Secondary Ion Species, Matrix Effects, and Anomalous Structures in Argon Gas Cluster Depth Profiles

M. P. Seah, R. Havelund and I. S. Gilmore

J. Phys. Chem. C, 2016, 120, 26328
DOI: 10.1021/acs.jpcc.6b08646

Label Free Particle-by-Particle Quantification of DNA Loading on Sorted Gold Nanostars

Michael J. Eller, Kavita Chandra, Emma E. Coughlin, Teri W. Odom and Emile A. Schweikert

Anal. Chem., 2019, 91, 5566
DOI: 10.1021/acs.analchem.8b03715

Soft depth-profiling of mixed peptide/lipid samples by means of cluster induced desorption/ionization mass spectrometry—High depth resolution and low matrix effect

André Portz, Satoka Aoyagi and Michael Dürr

Biointerphases, 2018, 13
DOI: 10.1116/1.5013151

Development and characterization of a stable adhesive bond between a poly(dimethylsiloxane) catheter material and a bacterial biofilm resistant acrylate polymer coating

Bonnie J. Tyler, Andrew Hook, Andreas Pelster, Paul Williams, Morgan Alexander and Heinrich F. Arlinghaus

Biointerphases, 2017, 12
DOI: 10.1116/1.4984011

A two‐point calibration method for quantifying organic binary mixtures using secondary ion mass spectrometry in the presence of matrix effects

Alexander G. Shard, Ako Miisho, Jean‐Luc Vorng, Rasmus Havelund, Ian S. Gilmore and Satoka Aoyagi

Surface & Interface Analysis, 2022, 54, 363
DOI: 10.1002/sia.7042

Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion Sources

Yuta Yokoyama, Satoka Aoyagi, Makiko Fujii, Jiro Matsuo, John S. Fletcher, Nicholas P. Lockyer, John C. Vickerman, Melissa K. Passarelli, Rasmus Havelund and Martin P. Seah

Anal. Chem., 2016, 88, 3592
DOI: 10.1021/acs.analchem.5b04133

SIMS of Organic Materials—Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions

R. Havelund, M. P. Seah, M. Tiddia and I. S. Gilmore

J. Am. Soc. Mass Spectrom., 2018, 29, 774
DOI: 10.1007/s13361-018-1905-2

Multimodal Imaging Based on Vibrational Spectroscopies and Mass Spectrometry Imaging Applied to Biological Tissue: A Multiscale and Multiomics Review

Michael Tuck, Landry Blanc, Rita Touti, Nathan Heath Patterson, Sebastiaan Van Nuffel, Sandrine Villette, Jean-Christophe Taveau, Andreas Römpp, Alain Brunelle, Sophie Lecomte and Nicolas Desbenoit

Anal. Chem., 2021, 93, 445
DOI: 10.1021/acs.analchem.0c04595

SIMS of organic layers with unknown matrix parameters: Locating the interface in dual beam argon gas cluster depth profiles

Rasmus Havelund, Martin P. Seah and Ian S. Gilmore

Surface & Interface Analysis, 2019, 51, 1332
DOI: 10.1002/sia.6701

Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra

Martin Wortmann, Klaus Viertel, Michael Westphal, Dominik Graulich, Yang Yang, Maik Gärner, Jan Schmalhorst, Natalie Frese and Timo Kuschel

Small Methods, 2024, 8
DOI: 10.1002/smtd.202300944

Practical guides for x-ray photoelectron spectroscopy: Analysis of polymers

Christopher D. Easton, Calum Kinnear, Sally L. McArthur and Thomas R. Gengenbach

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2020, 38
DOI: 10.1116/1.5140587

Nanoprojectile Secondary Ion Mass Spectrometry for Analysis of Extracellular Vesicles

Dmitriy S. Verkhoturov, Bruno P. Crulhas, Michael J. Eller, Yong D. Han, Stanislav V. Verkhoturov, Yordanos Bisrat, Alexander Revzin and Emile A. Schweikert

Anal. Chem., 2021, 93, 7481
DOI: 10.1021/acs.analchem.1c00689