Atomic spectrometry update. X-Ray fluorescence spectrometry

Margaret West, Andrew T. Ellis, Philip J. Potts, Christina Streli, Christine Vanhoof, Dariusz Wegrzynek and Peter Wobrauschek

J. Anal. At. Spectrom., 2009, 24, 1289
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Photon flux determination of a liquid-metal jet X-ray source by means of photon scattering

Malte Wansleben, Claudia Zech, Cornelia Streeck, Jan Weser, Christoph Genzel, Burkhard Beckhoff and Roland Mainz

J. Anal. At. Spectrom., 2019, 34, 1497
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Characterization of ultra-shallow aluminum implants in silicon by grazing incidence and grazing emission X-ray fluorescence spectroscopy

P. Hönicke, Y. Kayser, B. Beckhoff, M. Müller, J.-Cl. Dousse, J. Hoszowska and S. H. Nowak

J. Anal. At. Spectrom., 2012, 27, 1432
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Experimental determination of ruthenium L-shell fluorescence yields and Coster–Kronig transition probabilities

Nils Wauschkuhn, Katja Frenzel, Burkhard Beckhoff and Philipp Hönicke

J. Anal. At. Spectrom., 2023, 38, 1301
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Experimental determination of tantalum L-shell fluorescence yields and Coster–Kronig transition probabilities

Nils Wauschkuhn, Katja Frenzel, Burkhard Beckhoff and Philipp Hönicke

J. Anal. At. Spectrom., 2023, 38, 197
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Reference-free X-ray fluorescence analysis using well-known polychromatic synchrotron radiation

André Wählisch, Malte Wansleben, Rainer Unterumsberger, Yves Kayser and Burkhard Beckhoff

J. Anal. At. Spectrom., 2023, 38, 1865
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Accurate experimental determination of gallium K- and L3-shell XRF fundamental parameters

Rainer Unterumsberger, Philipp Hönicke, Julien L. Colaux, Chris Jeynes, Malte Wansleben, Matthias Müller and Burkhard Beckhoff

J. Anal. At. Spectrom., 2018, 33, 1003
DOI: 10.1039/C8JA00046H

Complementary methodologies for thin film characterization in one tool – a novel instrument for 450 mm wafers

Ina Holfelder, Burkhard Beckhoff, Rolf Fliegauf, Philipp Hönicke, Andreas Nutsch, Peter Petrik, Georg Roeder and Jan Weser

J. Anal. At. Spectrom., 2013, 28, 549
DOI: 10.1039/c3ja30324a

Depth profiling of low energy ion implantations in Si and Ge by means of micro-focused grazing emission X-ray fluorescence and grazing incidence X-ray fluorescence

Yves Kayser, Philipp Hönicke, Dariusz Banaś, Jean-Claude Dousse, Joanna Hoszowska, Paweł Jagodziński, Aldona Kubala-Kukuś, Stanisław H. Nowak and Marek Pajek

J. Anal. At. Spectrom., 2015, 30, 1086
DOI: 10.1039/C4JA00461B

Interaction of nanoparticle properties and X-ray analytical techniques

Rainer Unterumsberger, Philipp Hönicke, Yves Kayser, Beatrix Pollakowski-Herrmann, Saeed Gholhaki, Quanmin Guo, Richard E. Palmer and Burkhard Beckhoff

J. Anal. At. Spectrom., 2020, 35, 1022
DOI: 10.1039/D0JA00049C

Towards a traceable enhancement factor in surface-enhanced Raman spectroscopy

Eleonora Cara, Luisa Mandrile, Alessio Sacco, Andrea M. Giovannozzi, Andrea M. Rossi, Federica Celegato, Natascia De Leo, Philipp Hönicke, Yves Kayser, Burkhard Beckhoff, Davide Marchi, Alberto Zoccante, Maurizio Cossi, Michele Laus, Luca Boarino and Federico Ferrarese Lupi

J. Mater. Chem. C, 2020, 8, 16513
DOI: 10.1039/D0TC04364H

Structure and stability of 7-mercapto-4-methylcoumarin self-assembled monolayers on gold: an experimental and computational analysis

Davide Marchi, Eleonora Cara, Federico Ferrarese Lupi, Philipp Hönicke, Yves Kayser, Burkhard Beckhof, Micaela Castellino, Petr Klapetek, Alberto Zoccante, Michele Laus and Maurizio Cossi

Phys. Chem. Chem. Phys., 2022, 24, 22083
DOI: 10.1039/D2CP03103E

Certified ion implantation fluence by high accuracy RBS

Julien L. Colaux, Chris Jeynes, Keith C. Heasman and Russell M. Gwilliam

Analyst, 2015, 140, 3251
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Quantitative manganese dissolution investigation in lithium-ion batteries by means of X-ray spectrometry techniques

Claudia Zech, Marco Evertz, Markus Börner, Yves Kayser, Philipp Hönicke, Martin Winter, Sascha Nowak and Burkhard Beckhoff

J. Anal. At. Spectrom., 2021, 36, 2056
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A multi-edge study: investigating Co oxidation states of pristine LiNixMnyCo1−x−yO2 cathode materials by high energy-resolution X-ray spectrometry

Karina Bzheumikhova, Claudia Zech, Kai Schüler, John Vinson, Yves Kayser and Burkhard Beckhoff

Phys. Chem. Chem. Phys., 2024, 26, 10599
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Grazing incidence X-ray fluorescence of periodic structures – a comparison between X-ray standing waves and geometrical optics calculations

Falk Reinhardt, Stanisław H. Nowak, Burkhard Beckhoff, Jean-Claude Dousse and Max Schoengen

J. Anal. At. Spectrom., 2014, 29, 1778
DOI: 10.1039/C4JA00164H

Element sensitive reconstruction of nanostructured surfaces with finite elements and grazing incidence soft X-ray fluorescence

Victor Soltwisch, Philipp Hönicke, Yves Kayser, Janis Eilbracht, Jürgen Probst, Frank Scholze and Burkhard Beckhoff

Nanoscale, 2018, 10, 6177
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Thin film depth profiling by ion beam analysis

Chris Jeynes and Julien L. Colaux

Analyst, 2016, 141, 5944
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Reference-free quantification of particle-like surface contaminations by grazing incidence X-ray fluorescence analysis

Falk Reinhardt, János Osán, Szabina Török, Andrea Edit Pap, Michael Kolbe and Burkhard Beckhoff

J. Anal. At. Spectrom., 2012, 27, 248
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A mathematical model for deep ion implantation depth profiling by synchrotron radiation grazing-incidence X-ray fluorescence spectrometry

Mateusz Czyzycki, Mike Kokkoris and Andreas-Germanos Karydas

J. Anal. At. Spectrom., 2020, 35, 2964
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Laboratory based GIXRF and GEXRF spectrometers for multilayer structure investigations

Veronika Szwedowski-Rammert, Jonas Baumann, Christopher Schlesiger, Ulrich Waldschläger, Armin Gross, Birgit Kanngießer and Ioanna Mantouvalou

J. Anal. At. Spectrom., 2019, 34, 922
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Quantifying nitrogen in GeSbTe:N alloys

C. Jeynes, E. Nolot, C. Costa, C. Sabbione, W. Pessoa, F. Pierre, A. Roule, G. Navarro and M. Mantler

J. Anal. At. Spectrom., 2020, 35, 701
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Validation of secondary fluorescence excitation in quantitative X-ray fluorescence analysis of thin alloy films

André Wählisch, Cornelia Streeck, Philipp Hönicke and Burkhard Beckhoff

J. Anal. At. Spectrom., 2020, 35, 1664
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Titanium and titanium oxides at the K- and L-edges: comparing theoretical calculations to X-ray absorption and X-ray emission measurements

Karina Bzheumikhova, John Vinson, Rainer Unterumsberger, Malte Wansleben, Claudia Zech, Kai Schüler, Yves Kayser, Philipp Hönicke and Burkhard Beckhoff

J. Anal. At. Spectrom., 2023, 38, 1885
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A round robin test for total reflection X-ray fluorescence analysis using preselected and well characterized samples

Rainer Unterumsberger, Burkhard Beckhoff, Armin Gross, Hagen Stosnach, Sascha Nowak, Yannick P. Stenzel, Markus Krämer and Alex von Bohlen

J. Anal. At. Spectrom., 2021, 36, 1933
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Polysulfide driven degradation in lithium–sulfur batteries during cycling – quantitative and high time-resolution operando X-ray absorption study for dissolved polysulfides probed at both electrode sides

Claudia Zech, Philipp Hönicke, Yves Kayser, Sebastian Risse, Olga Grätz, Manfred Stamm and Burkhard Beckhoff

J. Mater. Chem. A, 2021, 9, 10231
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Absolute energies and emission line shapes of the L x-ray transitions of lanthanide metals

J W Fowler, G C O’Neil, B K Alpert, D A Bennett, E V Denison, W B Doriese, G C Hilton, L T Hudson, Y-I Joe, K M Morgan, D R Schmidt, D S Swetz, C I Szabo and J N Ullom

Metrologia, 2021, 58, 015016
DOI: 10.1088/1681-7575/abd28a

Quantitative Element‐Sensitive Analysis of Individual Nanoobjects

André Wählisch, Rainer Unterumsberger, Philipp Hönicke, Janin Lubeck, Yves Kayser, Jan Weser, Gaoliang Dai, Kai Hahm, Thomas Weimann, Christian Seim, Stefan Rehbein and Burkhard Beckhoff

Small, 2023, 19
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Evaluation of High-Resolution X-ray Absorption and Emission Spectroscopy for the Chemical Speciation of Binary Titanium Compounds

F. Reinhardt, B. Beckhoff, H. Eba, B. Kanngiesser, M. Kolbe, M. Mizusawa, M. Müller, B. Pollakowski, K. Sakurai and G. Ulm

Anal. Chem., 2009, 81, 1770
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An IAEA multi-technique X-ray spectrometry endstation at Elettra Sincrotrone Trieste: benchmarking results and interdisciplinary applications

Andreas Germanos Karydas, Mateusz Czyzycki, Juan José Leani, Alessandro Migliori, Janos Osan, Mladen Bogovac, Pawel Wrobel, Nikita Vakula, Roman Padilla-Alvarez, Ralf Hendrik Menk, Maryam Ghahremani Gol, Matias Antonelli, Manoj K Tiwari, Claudia Caliri, Katarina Vogel-Mikuš, Iain Darby and Ralf Bernd Kaiser

J Synchrotron Rad, 2018, 25, 189
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A step toward calculating the uncertainties in combined GIXRF‐XRR

Stephanie Melhem, Yves Ménesguen, Emmanuel Nolot and Marie‐Christine Lépy

X-Ray Spectrometry, 2023, 52, 412
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Fundamental parameters of Zr and Ti for a reliable quantitative X‐ray fluorescence analysis

Michael Kolbe and Philipp Hönicke

X-Ray Spectrometry, 2015, 44, 217
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A semi-analytical approach for the characterization of ordered 3D nanostructures using grazing-incidence X-ray fluorescence

K. V. Nikolaev, V. Soltwisch, P. Hönicke, F. Scholze, J. de la Rie, S. N. Yakunin, I. A. Makhotkin, R. W. E. van de Kruijs and F. Bijkerk

J Synchrotron Rad, 2020, 27, 386
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Ion Beam Analysis: A Century of Exploiting the Electronic and Nuclear Structure of the Atom for Materials Characterisation

Chris Jeynes, Roger P. Webb and Annika Lohstroh

Rev. Accl. Sci. Tech., 2011, 04, 41
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Comparative Study of Metal Quantification in Neurological Tissue Using Laser Ablation-Inductively Coupled Plasma-Mass Spectrometry Imaging and X-ray Fluorescence Microscopy

Katherine M. Davies, Dominic J. Hare, Sylvain Bohic, Simon A. James, Jessica L. Billings, David I. Finkelstein, Philip A. Doble and Kay L. Double

Anal. Chem., 2015, 87, 6639
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Ultralow energy boron implants in silicon characterization by nonoxidizing secondary ion mass spectrometry analysis and soft x-ray grazing incidence x-ray fluorescence techniques

Damiano Giubertoni, Erica Iacob, P. Hoenicke, B. Beckhoff, Giancarlo Pepponi, Salvatore Gennaro and Massimo Bersani

Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, 2010, 28, C1C84
DOI: 10.1116/1.3292638

Role of the mass attenuation coefficient database in standardization of a silicon drift X‐ray detector for PIXE analysis

Erin L. Flannigan, Christopher M. Heirwegh and John L. Campbell

X-Ray Spectrometry, 2018, 47, 63
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X-ray Spectrometry

Kouichi Tsuji, Kazuhiko Nakano, Yoshio Takahashi, Kouichi Hayashi and Chul-Un Ro

Anal. Chem., 2010, 82, 4950
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An accurate determination of the K‐shell X‐ray fluorescence yield of silicon

T. L. Hopman, C. M. Heirwegh, J. L. Campbell, M. Krumrey and F. Scholze

X-Ray Spectrometry, 2012, 41, 164
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SI traceable characterisation of nanomaterials by X-ray spectrometry

B Beckhoff

IOP Conf. Ser.: Mater. Sci. Eng., 2020, 891, 012003
DOI: 10.1088/1757-899X/891/1/012003

NickelLIIIfluorescence and satellite transition probabilities determined with an alternative methodology for soft-x-ray emission spectrometry

M. Müller, B. Beckhoff, R. Fliegauf and B. Kanngießer

Phys. Rev. A, 2009, 79
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Thermal stability and relaxation mechanisms in compressively strained Ge0.94Sn0.06 thin films grown by molecular beam epitaxy

C. Fleischmann, R. R. Lieten, P. Hermann, P. Hönicke, B. Beckhoff, F. Seidel, O. Richard, H. Bender, Y. Shimura, S. Zaima, N. Uchida, K. Temst, W. Vandervorst and A. Vantomme

Journal of Applied Physics, 2016, 120
DOI: 10.1063/1.4961396

Shape- and Element-Sensitive Reconstruction of Periodic Nanostructures with Grazing Incidence X-ray Fluorescence Analysis and Machine Learning

Anna Andrle, Philipp Hönicke, Grzegorz Gwalt, Philipp-Immanuel Schneider, Yves Kayser, Frank Siewert and Victor Soltwisch

Nanomaterials, 2021, 11, 1647
DOI: 10.3390/nano11071647

Transfer-Free In Situ CCVD Grown Nanocrystalline Graphene for Sub-PPMV Ammonia Detection

Dennis Noll, Philipp Hönicke, Yves Kayser, Stefan Wagner, Burkhard Beckhoff and Udo Schwalke

ECS J. Solid State Sci. Technol., 2018, 7, Q3108
DOI: 10.1149/2.0171807jss

X-Ray Induced Depth Profiling of Ion Implantations into Various Semiconductor Materials

Philipp Hönicke, Matthias Müller and Burkhard Beckhoff

SSP, 2012, 195, 274
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A calibration procedure for a traceable contamination analysis on medical devices by combined X-ray spectrometry and ambient spectroscopic techniques

Beatrix Pollakowski-Herrmann, Andrea Hornemann, Andrea M Giovannozzi, Felicia Green, Paul Gunning, Chiara Portesi, Andrea Rossi, Christian Seim, Rory Steven, Bonnie Tyler and Burkhard Beckhoff

Journal of Pharmaceutical and Biomedical Analysis, 2018, 150, 308
DOI: 10.1016/j.jpba.2017.12.007

Developing Quantitative Nondestructive Characterization of Nanomaterials: A Case Study on Sequential Infiltration Synthesis of Block Copolymers

Eleonora Cara, Philipp Hönicke, Yves Kayser, Jörg K. N. Lindner, Micaela Castellino, Irdi Murataj, Samuele Porro, Angelo Angelini, Natascia De Leo, Candido Fabrizio Pirri, Burkhard Beckhoff, Luca Boarino and Federico Ferrarese Lupi

ACS Appl. Polym. Mater., 2023, 5, 2079
DOI: 10.1021/acsapm.2c02094

A combined experimental and theoretical approach to determine X‐ray atomic fundamental quantities of tin

Y. Ménesguen, M.‐C. Lépy, J. M. Sampaio, J. P. Marques, F. Parente, M. Guerra, P. Indelicato, J. P. Santos, P. Hönicke and B. Beckhoff

X-Ray Spectrometry, 2018, 47, 341
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Quantification of Element Mass Concentrations in Ambient Aerosols by Combination of Cascade Impactor Sampling and Mobile Total Reflection X-ray Fluorescence Spectroscopy

Stefan Seeger, Janos Osan, Ottó Czömpöly, Armin Gross, Hagen Stosnach, Luca Stabile, Maria Ochsenkuehn-Petropoulou, Lamprini Areti Tsakanika, Theopisti Lymperopoulou, Sharon Goddard, Markus Fiebig, Francois Gaie-Levrel, Yves Kayser and Burkhard Beckhoff

Atmosphere, 2021, 12, 309
DOI: 10.3390/atmos12030309

L-subshell fluorescence yields and Coster-Kronig transition probabilities with a reliable uncertainty budget for selected high- and medium-Zelements

Michael Kolbe, Philipp Hönicke, Matthias Müller and Burkhard Beckhoff

Phys. Rev. A, 2012, 86
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Hybrid Metrology for Nanostructured Optical Metasurfaces

Irdi Murataj, Angelo Angelini, Eleonora Cara, Samuele Porro, Burkhard Beckhoff, Yves Kayser, Philipp Hönicke, Richard Ciesielski, Christian Gollwitzer, Victor Soltwisch, Francesc Perez-Murano, Marta Fernandez-Regulez, Stefano Carignano, Luca Boarino, Micaela Castellino and Federico Ferrarese Lupi

ACS Appl. Mater. Interfaces, 2023, 15, 57992
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Relative L3 transition probabilities of titanium compounds as a function of the oxidation state using high-resolution X-ray emission spectrometry

Rainer Unterumsberger, Philipp Hönicke, Beatrix Pollakowski-Herrmann, Matthias Müller and Burkhard Beckhoff

Spectrochimica Acta Part B: Atomic Spectroscopy, 2018, 145, 71
DOI: 10.1016/j.sab.2018.04.008

Ion beam analysis of Cu(In,Ga)Se 2 thin film solar cells

A.G. Karydas, C. Streeck, I. Bogdanovic Radovic, C. Kaufmann, T. Rissom, B. Beckhoff, M. Jaksic and N.P. Barradas

Applied Surface Science, 2015, 356, 631
DOI: 10.1016/j.apsusc.2015.08.133

Self-Affine Surface Roughness of Chemically and Thermally Cleaned Ge(100) Surfaces

C. Fleischmann, M. Houssa, S. Sioncke, B. Beckhoff, M. Müller, P. Hönicke, M. Meuris, K. Temst and A. Vantomme

J. Electrochem. Soc., 2011, 158, H1090
DOI: 10.1149/1.3624762

Experimental determination of line energies, line widths and relative transition probabilities of the Gadolinium L x-ray emission spectrum

Malte Wansleben, Yves Kayser, Philipp Hönicke, Ina Holfelder, André Wählisch, Rainer Unterumsberger and Burkhard Beckhoff

Metrologia, 2019, 56, 065007
DOI: 10.1088/1681-7575/ab40d2

A double crystal von Hamos spectrometer for traceable x-ray emission spectroscopy

I. Holfelder, M. Wansleben, Y. Kayser, R. Gnewkow, M. Müller, J. Weser, C. Zech and B. Beckhoff

Review of Scientific Instruments, 2021, 92
DOI: 10.1063/5.0061183

Grazing incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for the characterization of ultrashallow arsenic distribution in silicon

G. Pepponi, D. Giubertoni, M. Bersani, F. Meirer, D. Ingerle, G. Steinhauser, C. Streli, P. Hoenicke and B. Beckhoff

Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, 2010, 28, C1C59
DOI: 10.1116/1.3292647

Grazing incidence-x-ray fluorescence for a dimensional and compositional characterization of well-ordered 2D and 3D nanostructures

Philipp Hönicke, Anna Andrle, Yves Kayser, Konstantin V Nikolaev, Jürgen Probst, Frank Scholze, Victor Soltwisch, Thomas Weimann and Burkhard Beckhoff

Nanotechnology, 2020, 31, 505709
DOI: 10.1088/1361-6528/abb557

Magnesium K-Edge NEXAFS Spectroscopy of Chlorophyll a in Solution

Katharina Witte, Cornelia Streeck, Ioanna Mantouvalou, Svetlana A. Suchkova, Heiko Lokstein, Daniel Grötzsch, Wjatscheslav Martyanov, Jan Weser, Birgit Kanngießer, Burkhard Beckhoff and Holger Stiel

J. Phys. Chem. B, 2016, 120, 11619
DOI: 10.1021/acs.jpcb.6b05791

Quantitative surface characterization of silicon spheres by combined XRF and XPS analysis for the determination of the Avogadro constant

Matthias Müller, Burkhard Beckhoff, Edyta Beyer, Erik Darlatt, Rolf Fliegauf, Gerhard Ulm and Michael Kolbe

Metrologia, 2017, 54, 653
DOI: 10.1088/1681-7575/aa73c5

Development and Synchrotron‐Based Characterization of Al and Cr Nanostructures as Potential Calibration Samples for 3D Analytical Techniques

Masoud Dialameh, Federico Ferrarese Lupi, Philipp Hönicke, Yves Kayser, Burkhard Beckhoff, Thomas Weimann, Claudia Fleischmann, Wilfried Vandervorst, Pavo Dubček, Branko Pivac, Michele Perego, Gabriele Seguini, Natascia De Leo and Luca Boarino

Physica Status Solidi (a), 2018, 215
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Traceable Characterization of Nanomaterials by X-ray Spectrometry Using Calibrated Instrumentation

Burkhard Beckhoff

Nanomaterials, 2022, 12, 2255
DOI: 10.3390/nano12132255

Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam

Philipp Hönicke, André Wählisch, Rainer Unterumsberger, Burkhard Beckhoff, Janusz Bogdanowicz, Anne-Laure Charley, Hans Mertens, Névine Rochat, Jean-Michel Hartmann and Narciso Giambacorti

Nanotechnology, 2024, 35, 285702
DOI: 10.1088/1361-6528/ad3aff

CascadeL-shell soft-x-ray emission as incident x-ray photons are tuned across the1sionization threshold

D. Sokaras, A. G. Kochur, M. Müller, M. Kolbe, B. Beckhoff, M. Mantler, Ch. Zarkadas, M. Andrianis, A. Lagoyannis and A. G. Karydas

Phys. Rev. A, 2011, 83
DOI: 10.1103/PhysRevA.83.052511

In-line characterization of ultrathin transition metal dichalcogenides using X-ray fluorescence and X-ray photoelectron spectroscopy

E. Nolot, S. Cadot, F. Martin, P. Hönicke, C. Zech and B. Beckhoff

Spectrochimica Acta Part B: Atomic Spectroscopy, 2020, 166, 105788
DOI: 10.1016/j.sab.2020.105788

Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films

D. Abou-Ras, R. Caballero, C.-H. Fischer, C.A. Kaufmann, I. Lauermann, R. Mainz, H. Mönig, A. Schöpke, C. Stephan, C. Streeck, S. Schorr, A. Eicke, M. Döbeli, B. Gade, J. Hinrichs, T. Nunney, H. Dijkstra, V. Hoffmann, D. Klemm, V. Efimova, A. Bergmaier, G. Dollinger, T. Wirth, W. Unger, A.A. Rockett, A. Perez-Rodriguez, J. Alvarez-Garcia, V. Izquierdo-Roca, T. Schmid, P.-P. Choi, M. Müller, F. Bertram, J. Christen, H. Khatri, R.W. Collins, S. Marsillac and I. Kötschau

Microsc Microanal, 2011, 17, 728
DOI: 10.1017/S1431927611000523

Nondestructive and Nonpreparative Chemical Nanometrology of Internal Material Interfaces at Tunable High Information Depths

Beatrix Pollakowski, Peter Hoffmann, Marina Kosinova, Olaf Baake, Valentina Trunova, Rainer Unterumsberger, Wolfgang Ensinger and Burkhard Beckhoff

Anal. Chem., 2013, 85, 193
DOI: 10.1021/ac3024872

Improved x-ray mass attenuation coefficient (opacity) measurements for Fe, Ni and Au

H Huang, K Sequoia, M Yamaguchi, K J Boehm, K Engelhorn, J Walker, F Elsner, J Tomlin, M Farrell, C J Fontes and J P Colgan

J. Phys. B: At. Mol. Opt. Phys., 2021, 54, 115003
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Nondestructive characterization of nanoscale layered samples

Olaf Baake, Peter S. Hoffmann, Stefan Flege, Hugo M. Ortner, Sebastian Gottschalk, Wolfram Berky, Adam G. Balogh, Wolfgang Ensinger, Burkhard Beckhoff, Michael Kolbe, Martin Gerlach, Beatrix Pollakowski, Jan Weser, Gerhard Ulm, Michael Haschke, Elena Blokhina, Markus Peter, Dominique Porta and Martin Heck

Anal Bioanal Chem, 2009, 393, 623
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The xraylib library for X-ray–matter interactions. Recent developments

Tom Schoonjans, Antonio Brunetti, Bruno Golosio, Manuel Sanchez del Rio, Vicente Armando Solé, Claudio Ferrero and Laszlo Vincze

Spectrochimica Acta Part B: Atomic Spectroscopy, 2011, 66, 776
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The U125 insertion device beamline at the Metrology Light Source

Alexander Gottwald, Hendrik Kaser and Michael Kolbe

J Synchrotron Rad, 2019, 26, 535
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Experimental determination of differential scattering coefficients for nickel by means of linearly polarized x-ray radiation

André Wählisch, Malte Wansleben, Jan Weser, Christian Stadelhoff, Ina Holfelder, Yves Kayser and Burkhard Beckhoff

Metrologia, 2023, 60, 035001
DOI: 10.1088/1681-7575/acca87

What are the correct L‐subshell photoionization cross sections for quantitative X‐ray spectroscopy?

Philipp Hönicke, Michael Kolbe and Burkhard Beckhoff

X-Ray Spectrometry, 2016, 45, 207
DOI: 10.1002/xrs.2691

Near-edge x-ray absorption and emission of cyanates and thiocyanates

Karina Bzheumikhova, John Vinson, Rainer Unterumsberger, Yves Kayser, Terrence Jach and Burkhard Beckhoff

Phys. Rev. B, 2022, 106
DOI: 10.1103/PhysRevB.106.125133

Determination of SiO2and C layers on a monocrystalline silicon sphere by reference-free x-ray fluorescence analysis

Philipp Hönicke, Ina Holfelder, Michael Kolbe, Janin Lubeck, Beatrix Pollakowski-Herrmann, Rainer Unterumsberger, Jan Weser and Burkhard Beckhoff

Metrologia, 2017, 54, 481
DOI: 10.1088/1681-7575/aa765f

Reference-free grazing incidence x-ray fluorescence and reflectometry as a methodology for independent validation of x-ray reflectometry on ultrathin layer stacks and a depth-dependent characterization

Philipp Hönicke, Blanka Detlefs, Emmanuel Nolot, Yves Kayser, Uwe Mühle, Beatrix Pollakowski and Burkhard Beckhoff

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2019, 37
DOI: 10.1116/1.5094891

Towards a calibration of laboratory setups for grazing incidence and total-reflection X-ray fluorescence analysis

Philipp Hönicke, Ulrich Waldschläger, Thomas Wiesner, Markus Krämer and Burkhard Beckhoff

Spectrochimica Acta Part B: Atomic Spectroscopy, 2020, 174, 106009
DOI: 10.1016/j.sab.2020.106009

Experimental and theoretical approaches for determining the K-shell fluorescence yield of carbon

Philipp Hönicke, Rainer Unterumsberger, Nils Wauschkuhn, Markus Krämer, Burkhard Beckhoff, Paul Indelicato, Jorge Sampaio, José Pires Marques, Mauro Guerra, Fernando Parente and José Paulo Santos

Radiation Physics and Chemistry, 2023, 202, 110501
DOI: 10.1016/j.radphyschem.2022.110501

Liquid-Phase Adsorption of Sulfur on Germanium: Reaction Mechanism and Atomic Geometry

Claudia Fleischmann, Michel Houssa, Matthias Müller, Burkhard Beckhoff, Hans-Gerd Boyen, Marc Meuris, Kristiaan Temst and André Vantomme

J. Phys. Chem. C, 2013, 117, 7451
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Characterization of High-k Nanolayers by Grazing Incidence X-ray Spectrometry

Matthias Müller, Philipp Hönicke, Blanka Detlefs and Claudia Fleischmann

Materials, 2014, 7, 3147
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Comparing existing MAC tables – hints to possible developments

Pierre Caussin

Powder Diffr., 2013, 28, 90
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Quantitative comparison of preparation methodologies for x-ray fluorescence microscopy of brain tissue

Simon A. James, Damian E. Myers, Martin D. de Jonge, Stefan Vogt, Chris G. Ryan, Brett A. Sexton, Pamela Hoobin, David Paterson, Daryl L. Howard, Sheridan C. Mayo, Matteo Altissimo, Gareth F. Moorhead and Stephen W. Wilkins

Anal Bioanal Chem, 2011, 401, 853
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A flexible setup for angle-resolved X-ray fluorescence spectrometry with laboratory sources

M. Spanier, C. Herzog, D. Grötzsch, F. Kramer, I. Mantouvalou, J. Lubeck, J. Weser, C. Streeck, W. Malzer, B. Beckhoff and B. Kanngießer

Review of Scientific Instruments, 2016, 87
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Measuring and Interpreting X-ray Fluorescence from Planetary Surfaces

Alan Owens, Burkhard Beckhoff, George Fraser, Michael Kolbe, Michael Krumrey, Alfonso Mantero, Michael Mantler, Anthony Peacock, Maria-Grazia Pia, Derek Pullan, Uwe G. Schneider and Gerhard Ulm

Anal. Chem., 2008, 80, 8398
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Proton induced quasi-monochromatic x-ray beams for soft x-ray spectroscopy studies and selective x-ray fluorescence analysis

D. Sokaras, Ch. Zarkadas, R. Fliegauf, B. Beckhoff and A. G. Karydas

Review of Scientific Instruments, 2012, 83
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Laboratory Setup for Scanning-Free Grazing Emission X-ray Fluorescence

J. Baumann, C. Herzog, M. Spanier, D. Grötzsch, L. Lühl, K. Witte, A. Jonas, S. Günther, F. Förste, R. Hartmann, M. Huth, D. Kalok, D. Steigenhöfer, M. Krämer, T. Holz, R. Dietsch, L. Strüder, B. Kanngießer and I. Mantouvalou

Anal. Chem., 2017, 89, 1965
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Traceable Quantitative Raman Microscopy and X-ray Fluorescence Analysis as Nondestructive Methods for the Characterization of Cu(In,Ga)Se2 Absorber Films

Sabine Zakel, Beatrix Pollakowski, Cornelia Streeck, Stefan Wundrack, Alfons Weber, Stefan Brunken, Roland Mainz, Burckhardt Beckhoff and Rainer Stosch

Appl Spectrosc, 2016, 70, 279
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Measurement of L subshell fluorescence yields of some rare earth elements using synchrotron radiation

Krishnananda, Santosh Mirji, Mutturaj Hosamani, N. M. Badiger, M. K. Tiwari and G. S. Lodha

X-Ray Spectrometry, 2016, 45, 72
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Focusing of soft X-ray radiation and characterization of the beam profile enabling X-ray emission spectrometry at nanolayered specimens

R. Unterumsberger, M. Müller, B. Beckhoff, P. Hönicke, B. Pollakowski and S. Bjeoumikhova

Spectrochimica Acta Part B: Atomic Spectroscopy, 2012, 78, 37
DOI: 10.1016/j.sab.2012.10.001

Primary calibration of photodiodes with monochromatic X‐ray beams using an electrical‐substitution radiometer

Víctor H. Elvira, Marie‐Christine Lépy and Yves Ménesguen

X-Ray Spectrometry, 2023, 52, 279
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Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films: Additional Techniques

Daniel Abou-Ras, Raquel Caballero, Cornelia Streeck, Burkhard Beckhoff, Jung-Hwan In and Sungho Jeong

Microsc Microanal, 2015, 21, 1644
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Theoretical and experimental determination ofL-shell decay rates, line widths, and fluorescence yields in Ge

M. Guerra, J. M. Sampaio, T. I. Madeira, F. Parente, P. Indelicato, J. P. Marques, J. P. Santos, J. Hoszowska, J.-Cl. Dousse, L. Loperetti, F. Zeeshan, M. Müller, R. Unterumsberger and B. Beckhoff

Phys. Rev. A, 2015, 92
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Quantitative Analysis and 2D/3D Elemental Imaging of Cocoa Beans Using X-ray Fluorescence Techniques

Frank Förste, Leona Bauer, Cornelia Streeck, Martin Radtke, Uwe Reinholz, Daniel Kadow, Claudia Keil and Ioanna Mantouvalou

Anal. Chem., 2023, 95, 5627
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A sealable ultrathin window sample cell for the study of liquids by means of soft X-ray spectroscopy

D. Grötzsch, C. Streeck, C. Nietzold, W. Malzer, I. Mantouvalou, A. Nutsch, P. Dietrich, W. Unger, B. Beckhoff and B. Kanngießer

Review of Scientific Instruments, 2017, 88
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ALD Growth Behavior of High-K Nanolayers on Various Substrates Characterized by X-Ray Spectrometry in Gracing Incidence Geometry

Matthias Müller, Sonja Sioncke, Annelies Delabie and Burkhard Beckhoff

SSP, 2012, 195, 95
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Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysis

H. Rotella, B. Caby, Y. Ménesguen, Y. Mazel, A. Valla, D. Ingerle, B. Detlefs, M.-C. Lépy, A. Novikova, G. Rodriguez, C. Streli and E. Nolot

Spectrochimica Acta Part B: Atomic Spectroscopy, 2017, 135, 22
DOI: 10.1016/j.sab.2017.06.011

Experimental determination of the x-ray atomic fundamental parameters of nickel

Y Ménesguen, M-C Lépy, P Hönicke, M Müller, R Unterumsberger, B Beckhoff, J Hoszowska, J-Cl Dousse, W Błachucki, Y Ito, M Yamashita and S Fukushima

Metrologia, 2018, 55, 56
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Theoretical and experimental determination of K - and L -shell x-ray relaxation parameters in Ni

M. Guerra, J. M. Sampaio, F. Parente, P. Indelicato, P. Hönicke, M. Müller, B. Beckhoff, J. P. Marques and J. P. Santos

Phys. Rev. A, 2018, 97
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A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies

J. Lubeck, B. Beckhoff, R. Fliegauf, I. Holfelder, P. Hönicke, M. Müller, B. Pollakowski, F. Reinhardt and J. Weser

Review of Scientific Instruments, 2013, 84
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Reliable compositional analysis of airborne particulate matter beyond the quantification limits of total reflection X-ray fluorescence

Yves Kayser, János Osán, Philipp Hönicke and Burkhard Beckhoff

Analytica Chimica Acta, 2022, 1192, 339367
DOI: 10.1016/j.aca.2021.339367

Choice of X‐ray mass attenuation coefficients for PIXE analysis of silicate minerals and rocks

Christopher M. Heirwegh, Irina Pradler and John L. Campbell

X-Ray Spectrometry, 2015, 44, 63
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Development and characterization of sub-monolayer coatings as novel calibration samples for X-ray spectroscopy

Philipp Hönicke, Markus Krämer, Lars Lühl, Konstantin Andrianov, Burkhard Beckhoff, Rainer Dietsch, Thomas Holz, Birgit Kanngießer, Danny Weißbach and Thomas Wilhein

Spectrochimica Acta Part B: Atomic Spectroscopy, 2018, 145, 36
DOI: 10.1016/j.sab.2018.04.001

A quarter‐century of metrology using synchrotron radiation by PTB in Berlin

Burkhard Beckhoff, Alexander Gottwald, Roman Klein, Michael Krumrey, Ralph Müller, Mathias Richter, Frank Scholze, Reiner Thornagel and Gerhard Ulm

Physica Status Solidi (b), 2009, 246, 1415
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Experimental Verification of the Individual Energy Dependencies of the PartialL-Shell Photoionization Cross Sections of Pd and Mo

Philipp Hönicke, Michael Kolbe, Matthias Müller, Michael Mantler, Markus Krämer and Burkhard Beckhoff

Phys. Rev. Lett., 2014, 113
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An accuracy assessment of photo-ionization cross-section datasets for 1–2 keV x-rays in light elements using PIXE

C M Heirwegh, I Pradler and J L Campbell

J. Phys. B: At. Mol. Opt. Phys., 2013, 46, 185602
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Quantification via X‐ray fluorescence analysis of oxygen in the surface layer of a Si‐sphere used as a new mass standard

Yu‐Hsin Wu, Lin Tsao, Jeng‐Yu Chiu, Sheng‐Jui Chen, Rolf Fliegauf, Matthias Müller, Edyta Beyer and Michael Kolbe

X-Ray Spectrometry, 2022, 51, 122
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“Total IBA” – Where are we?

C. Jeynes, M.J. Bailey, N.J. Bright, M.E. Christopher, G.W. Grime, B.N. Jones, V.V. Palitsin and R.P. Webb

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2012, 271, 107
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Grazing angle X-ray fluorescence from periodic structures on silicon and silica surfaces

S.H. Nowak, D. Banaś, W. Błchucki, W. Cao, J.-Cl. Dousse, P. Hönicke, J. Hoszowska, Ł. Jabłoński, Y. Kayser, A. Kubala-Kukuś, M. Pajek, F. Reinhardt, A.V. Savu and J. Szlachetko

Spectrochimica Acta Part B: Atomic Spectroscopy, 2014, 98, 65
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Picoliter solution deposition for total reflection X-ray fluorescence analysis of semiconductor samples

Chris M. Sparks, Ursula E.A. Fittschen and George J. Havrilla

Spectrochimica Acta Part B: Atomic Spectroscopy, 2010, 65, 805
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A novel and holistic approach for experimental x-ray fundamental parameter determination—the Ru L-shell

Philipp Hönicke

New J. Phys., 2023, 25, 073012
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Experimental determination of the gadolinium L subshells fluorescence yields and Coster‐Kronig transition probabilities

Yves Kayser, Philipp Hönicke, Malte Wansleben, André Wählisch and Burkhard Beckhoff

X-Ray Spectrometry, 2023, 52, 235
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Reference-free, depth-dependent characterization of nanolayers and gradient systems with advanced grazing incidence X-ray fluorescence analysis

Philipp Hönicke, Blanka Detlefs, Matthias Müller, Erik Darlatt, Emmanuel Nolot, Helen Grampeix and Burkhard Beckhoff

Phys. Status Solidi A, 2015, 212, 523
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Complementary Characterization of Buried Nanolayers by Quantitative X-ray Fluorescence Spectrometry under Conventional and Grazing Incidence Conditions

Rainer Unterumsberger, Beatrix Pollakowski, Matthias Müller and Burkhard Beckhoff

Anal. Chem., 2011, 83, 8623
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Towards Passivation of Ge(100) Surfaces by Sulfur Adsorption from a (NH4)2S Solution: A Combined NEXAFS, STM and LEED Study

C. Fleischmann, S. Sioncke, S. Couet, K. Schouteden, B. Beckhoff, M. Müller, P. Hönicke, M. Kolbe, C. Van Haesendonck, M. Meuris, K. Temst and A. Vantomme

J. Electrochem. Soc., 2011, 158, H589
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Reaction mechanisms for atomic layer deposition of aluminum oxide on semiconductor substrates

Annelies Delabie, Sonja Sioncke, Jens Rip, Sven Van Elshocht, Geoffrey Pourtois, Matthias Mueller, Burkhard Beckhoff and Kristine Pierloot

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2012, 30
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Quantitative depth-profile analysis of transition metal nitride materials with combined grazing-incidence X-ray fluorescence and X-ray reflectometry analysis

S. Torrengo, D. Eichert, Y. Mazel, M. Bernard, Y. Ménesguen, M.C. Lépy and E. Nolot

Spectrochimica Acta Part B: Atomic Spectroscopy, 2020, 171, 105926
DOI: 10.1016/j.sab.2020.105926

Experimental determination of the oxygen K-shell fluorescence yield using thin SiO 2 and Al 2 O 3 foils

P. Hönicke, M. Kolbe, M. Krumrey, R. Unterumsberger and B. Beckhoff

Spectrochimica Acta Part B: Atomic Spectroscopy, 2016, 124, 94
DOI: 10.1016/j.sab.2016.08.024

Elemental depth profiling of Cu(In,Ga)Se2 thin films by reference-free grazing incidence X-ray fluorescence analysis

C. Streeck, B. Beckhoff, F. Reinhardt, M. Kolbe, B. Kanngießer, C.A. Kaufmann and H.W. Schock

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2010, 268, 277
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Accurate Determination of Quantity of Material in Thin Films by Rutherford Backscattering Spectrometry

C. Jeynes, N. P. Barradas and E. Szilágyi

Anal. Chem., 2012, 84, 6061
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Chemical imaging analysis of the brain with X-ray methods

Joanna F Collingwood and Freddy Adams

Spectrochimica Acta Part B: Atomic Spectroscopy, 2017, 130, 101
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Investigation of a cleaning procedure for silicon spheres used in the realization and dissemination of the redefined kilogram via combined spectroscopic and gravimetric measurements

Edyta Beyer, Michael Borys, Michael Mecke and Michael Kolbe

Int. J. Metrol. Qual. Eng., 2020, 11, 18
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Absorption Correction for 3D Elemental Distributions of Dental Composite Materials Using Laboratory Confocal Micro-X-ray Fluorescence Spectroscopy

Leona J. Bauer, Frank Wieder, Vinh Truong, Frank Förste, Yannick Wagener, Adrian Jonas, Sebastian Praetz, Christopher Schlesiger, Andreas Kupsch, Bernd R. Müller, Birgit Kanngießer, Paul Zaslansky and Ioanna Mantouvalou

Anal. Chem., 2024, 96, 8441
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