Issue 17, 2022

Inch-size Cs3Bi2I9 polycrystalline wafers with near-intrinsic properties for ultralow-detection-limit X-ray detection

Abstract

Lead-free perovskites are promising for next-generation bio-friendly X-ray detector materials, while it remains a challenge to fabricate high-quality wafers at a macroscopic scale using a readily scalable method. Herein, a solvent-free mechanochemical fabrication method is developed to produce inch-size lead-free perovskite Cs3Bi2I9 crystalline-wafers. It is surprising to see that these polycrystalline wafers exhibit near-intrinsic properties, and more specifically, the apparent trap density is measured to be as low as 5.26 × 10−10 cm−3, essentially the same as that of their single-crystal counterparts. Therefore, the X-ray detector fabricated on the Cs3Bi2I9 wafer delivers high sensitivity up to 230.46 ± 19.86 μC Gyair−1 cm−2 and a detection limit as low as 61.25 nGyair s−1 under a 40 kV X-ray source and 40 V mm−1 electric field. This research provides a readily scalable method for fabricating large perovskite wafers with near-intrinsic properties for general commercial applications.

Graphical abstract: Inch-size Cs3Bi2I9 polycrystalline wafers with near-intrinsic properties for ultralow-detection-limit X-ray detection

Supplementary files

Article information

Article type
Paper
Submitted
12 feb. 2022
Accepted
02 apr. 2022
First published
07 apr. 2022

J. Mater. Chem. C, 2022,10, 6665-6672

Inch-size Cs3Bi2I9 polycrystalline wafers with near-intrinsic properties for ultralow-detection-limit X-ray detection

N. Bu, S. Jia, Y. Xiao, H. Li, N. Li, X. Liu, Z. Yang, K. Zhao and S. (. Liu, J. Mater. Chem. C, 2022, 10, 6665 DOI: 10.1039/D2TC00599A

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