Issue 24, 2020

Evolution of short-range order in chemically and physically grown thin film bilayer structures for electronic applications

Abstract

Functional thin films are commonly integrated in electronic devices as part of a multi-layer architecture. Metal/oxide/metal structures e.g. in resistive switching memory and piezoelectric microelectrochemical devices are relevant applications. The films are mostly fabricated from the vapour phase or by solution deposition. Processing conditions with a limited thermal budget typically yield nanocrystalline or amorphous layers. For these aperiodic materials, the structure is described in terms of the local atomic order on the length scale of a few chemical bonds up to several nanometres. Previous structural studies of the short-range order in thin films have addressed the simple case of single coatings on amorphous substrates. By contrast, this work demonstrates how to probe the local structure of two stacked functional layers by means of grazing incidence total X-ray scattering and pair distribution function (PDF) analysis. The key to separating the contributions of the individual thin films is the variation of the incidence angle below the critical angle of total external reflection, In this way, structural information was obtained for functional oxides on textured electrodes, i.e. PbZr0.53O0.47O3 on Pt[111] and HfO2 on TiN, as well as HfO2–TiOx bilayers. For these systems, the transformations from disordered phases into periodic structures via thermal teatment are described. These examples highlight the opportunity to develop a detailed understanding of structural evolution during the fabrication of real thin film devices using the PDF technique.

Graphical abstract: Evolution of short-range order in chemically and physically grown thin film bilayer structures for electronic applications

Supplementary files

Article information

Article type
Paper
Submitted
04 mar. 2020
Accepted
18 maí 2020
First published
16 jún. 2020

Nanoscale, 2020,12, 13103-13112

Evolution of short-range order in chemically and physically grown thin film bilayer structures for electronic applications

A. Dippel, O. Gutowski, L. Klemeyer, U. Boettger, F. Berg, T. Schneller, A. Hardtdegen, S. Aussen, S. Hoffmann-Eifert and M. v. Zimmermann, Nanoscale, 2020, 12, 13103 DOI: 10.1039/D0NR01847C

To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.

If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.

If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.

Read more about how to correctly acknowledge RSC content.

Social activity

Spotlight

Advertisements