Issue 45, 2013

Direct observations of the MOF (UiO-66) structure by transmission electron microscopy

Abstract

As a demonstration of ab initio structure characterizations of nano metal organic framework (MOF) crystals by high resolution transmission electron microscopy (HRTEM) and electron diffraction tomography methods, a Zr-MOF (UiO-66) structure was determined and further confirmed by Rietveld refinements of powder X-ray diffraction. HRTEM gave direct imaging of the channels.

Graphical abstract: Direct observations of the MOF (UiO-66) structure by transmission electron microscopy

Supplementary files

Article information

Article type
Communication
Submitted
12 जून 2013
Accepted
19 अगस्त 2013
First published
19 अगस्त 2013

CrystEngComm, 2013,15, 9356-9359

Direct observations of the MOF (UiO-66) structure by transmission electron microscopy

L. Zhu, D. Zhang, M. Xue, H. Li and S. Qiu, CrystEngComm, 2013, 15, 9356 DOI: 10.1039/C3CE41122B

To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.

If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.

If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.

Read more about how to correctly acknowledge RSC content.

Social activity

Spotlight

Advertisements