Issue 40, 2019

Mechanical probing of ferroelectrics at the nanoscale

Abstract

Mechanical properties of ferroelectric materials at the nanoscale have received growing interest over the past years due to new developments in scientific instrumentation and novel materials that allow for the study of so far scarcely investigated and/or hidden nanoscale phenomena. The use of atomic force microscopy (AFM) as the main investigation tool has shed new light onto various areas of interest, from non-destructive probing of Young's modulus to mechanically triggered phase transitions at nanoscale regions in ferroelectrics. Together with various theoretical approaches, these scanning probe microscopy based concepts provide a powerful platform for nanoscale mechanical property studies. Here we provide an overview of recent developments and investigations, and give an outlook to future opportunities in this research area.

Graphical abstract: Mechanical probing of ferroelectrics at the nanoscale

Article information

Article type
Review Article
Submitted
20 मई 2019
Accepted
25 सितम्बर 2019
First published
30 सितम्बर 2019

J. Mater. Chem. C, 2019,7, 12441-12462

Mechanical probing of ferroelectrics at the nanoscale

Y. Heo, P. Sharma, Y. Y. Liu, J. Y. Li and J. Seidel, J. Mater. Chem. C, 2019, 7, 12441 DOI: 10.1039/C9TC02661D

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