Issue 9, 2023

Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique

Abstract

A hybrid technique combining atomic force microscopy and the fixed-junction technique is developed to simultaneously probe the electrical and mechanical characteristics of a single-molecule junction.

Graphical abstract: Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique

Supplementary files

Article information

Article type
Communication
Submitted
31 oct. 2022
Accepted
28 déc. 2022
First published
12 janv. 2023

Nanoscale, 2023,15, 4277-4281

Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique

L. Yu, M. Zhang, H. Chen, B. Xiao and S. Chang, Nanoscale, 2023, 15, 4277 DOI: 10.1039/D2NR06074D

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