Determination of F, Na, Mg, Al and P in Indian tea powders by a proton induced γ-ray emission technique

Y. Sunitha, A. Sarkar and Sanjiv Kumar

Anal. Methods, 2016, 8, 7116
DOI: 10.1039/C6AY01855F

Thin film depth profiling by ion beam analysis

Chris Jeynes and Julien L. Colaux

Analyst, 2016, 141, 5944
DOI: 10.1039/C6AN01167E

A mathematical model for deep ion implantation depth profiling by synchrotron radiation grazing-incidence X-ray fluorescence spectrometry

Mateusz Czyzycki, Mike Kokkoris and Andreas-Germanos Karydas

J. Anal. At. Spectrom., 2020, 35, 2964
DOI: 10.1039/D0JA00346H

Accurate electronics calibration for particle backscattering spectrometry

Julien L. Colaux and Chris Jeynes

Anal. Methods, 2015, 7, 3096
DOI: 10.1039/C4AY02988G

Accurate experimental determination of gallium K- and L3-shell XRF fundamental parameters

Rainer Unterumsberger, Philipp Hönicke, Julien L. Colaux, Chris Jeynes, Malte Wansleben, Matthias Müller and Burkhard Beckhoff

J. Anal. At. Spectrom., 2018, 33, 1003
DOI: 10.1039/C8JA00046H

The Future of Industrial Accelerators and Applications

Barney L. Doyle, Floyd “Del” McDaniel and Robert W. Hamm

Rev. Accl. Sci. Tech., 2019, 10, 93
DOI: 10.1142/S1793626819300068

On defects’ role in enhanced perpendicular magnetic anisotropy in Pt/Co/Pt, induced by ion irradiation

M M Jakubowski, M O Liedke, M Butterling, E Dynowska, I Sveklo, E Milińska, Z Kurant, R Böttger, J von Borany, A Maziewski, A Wagner and A Wawro

J. Phys.: Condens. Matter, 2019, 31, 185801
DOI: 10.1088/1361-648X/ab0351

Study of doping uniformity of a 200 kV ion implanter by RBS and sheet resistance measurements

Hui Li, Ze-Song Wang, Sheng-Jun Zhang, Vasiliy O. Pelenovich, Feng Ren, De-Jun Fu, Chuan-Sheng Liu and Zhi-Wei Ai

NUCL SCI TECH, 2016, 27
DOI: 10.1007/s41365-016-0058-x

On the accuracy of Total-IBA

C. Jeynes, V.V. Palitsin, M. Kokkoris, A. Hamilton and G.W. Grime

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2020, 465, 85
DOI: 10.1016/j.nimb.2019.12.019

On the traceably accurate voltage calibration of electrostatic accelerators

J.L. Colaux, G. Terwagne and C. Jeynes

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2015, 349, 173
DOI: 10.1016/j.nimb.2015.02.048

Elastic backscattering during boron implantation in Si1-Ge

Quan Bai, Masoud Dialameh, Richard J.H. Morris, Ian Vickridge, André Vantomme and Johan Meersschaut

Vacuum, 2024, 219, 112740
DOI: 10.1016/j.vacuum.2023.112740

18O(p,p′γ)18O nuclear reaction in the determination of oxygen by proton induced γ-ray emission

Y. Sunitha and Sanjiv Kumar

J Radioanal Nucl Chem, 2017, 314, 1803
DOI: 10.1007/s10967-017-5575-5

RBS as a new primary direct reference method for measuring quantity of material

C. Jeynes

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2017, 406, 30
DOI: 10.1016/j.nimb.2016.11.041

The effect of RF plasma power on remote plasma sputtered AZO thin films

B.C. Bussell, P.N. Gibson, J. Lawton, P. Couture, M.K. Sharpe, J. England, S.J. Hinder, V. Stolojan, S.A. Thornley and M.A. Baker

Surface and Coatings Technology, 2022, 442, 128402
DOI: 10.1016/j.surfcoat.2022.128402

High-throughput MeV ion beam analysis − quantitative full stoichiometry imaging of a granite

S. Möller, K.F. Muzakka, D. Höschen and M. Finsterbusch

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2025, 560, 165626
DOI: 10.1016/j.nimb.2025.165626

Methods and techniques for in vitro subcellular localization of radiopharmaceuticals and radionuclides

Ines M. Costa, Jordan Cheng, Katarzyna M. Osytek, Cinzia Imberti and Samantha Y.A. Terry

Nuclear Medicine and Biology, 2021, 98-99, 18
DOI: 10.1016/j.nucmedbio.2021.03.010

Bias and synergy in the self-consistent approach of data analysis of ion beam techniques

T.F. Silva, C.L. Rodrigues, M.H. Tabacniks, U. von Toussaint and M. Mayer

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2022, 533, 9
DOI: 10.1016/j.nimb.2022.10.008

Applications of machine learning in ion beam analysis of materials

Tiago Fiorini da Silva

Journal of Vacuum Science & Technology A, 2025, 43
DOI: 10.1116/6.0004277

Quantification of boron in a SiGe epilayer using ion beam analysis

Quan Bai, Masoud Dialameh, Anna H. Chakkunny, Richard J.H. Morris, Clément Porret, André Vantomme and Johan Meersschaut

Applied Surface Science, 2026, 725, 165787
DOI: 10.1016/j.apsusc.2025.165787