Jump to main content
Jump to site search
Access to RSC content Close the message box

Continue to access RSC content when you are not at your institution. Follow our step-by-step guide.


All chapters
Previous chapter Next chapter

Chapter 9

Scanning Thermal Microscopy

Scanning Thermal Microscopy (SThM) allows nanoscale temperature and heat flow measurements as well as thermal characterization of materials. This chapter focuses on fundamentals and applications of SThM methods. It reviews the main Scanning Probe Microscopy techniques developed for thermal imaging with nanoscale spatial resolution and presents selected SThM applications. After reviewing the fundamentals of thermal metrology by contact, it describes the approaches currently used to calibrate SThM probes. In many cases, the link between the nominal measured signal and the investigated parameter is not yet fully understood, due to the complexity of the micro-/nanoscale interaction between the probe and the sample. Special attention is given to this interaction, which conditions the tip–sample interface temperature. Some examples of the main applications of SThM are presented. Finally, future challenges and opportunities for SThM are discussed.

Publication details


Print publication date
05 Oct 2015
Copyright year
2016
Print ISBN
978-1-84973-904-7
PDF eISBN
978-1-78262-203-1
ePub eISBN
978-1-78262-725-8