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Recent developments in transmission electron microscopy and their application for nanoparticle characterisation

This chapter outlines how the recent advancements in transmission electron microscope instrumentation have provided new opportunities for high resolution characterisation of inorganic nanoparticle systems. Concentrating on the smallest nanoclusters, nanocrystals and nanoparticles with diameters of 1–50nm we outline how the development of aberration correcting lenses,1–4 brighter, more coherent electron sources,5,6 and smarter, more efficient detector systems,7 has improved electron microscopy imaging and analysis at the nanoscale.8–10

Publication details

Print publication date
31 Dec 2012
Copyright year
2012
Print ISBN
978-1-84973-435-6
PDF eISBN
978-1-84973-484-4

From the book series:
SPR - Nanoscience