Polarization-dependent total reflection fluorescence extended X-ray absorption fine structure and its application to supported catalysis
Polarization-dependent total reflection fluorescence-extended X-ray absorption fine structure (PTRF-EXAFS) is a powerful tool to investigate the structures of highly dispersed metal clusters on oxide surfaces that provide a model system for supported metal catalysts. PTRF-EXAFS provides three-dimensional structural information of the dispersed metal clusters, in addition to the metal-support interface structure in the presence of a gas phase. Results from PTRF-EXAFS have revealed that the metal species interacts strongly with surface anions. Finally the future of PTRF-EXAFS is discussed in combination with the next generation light sources, such as X-ray free electron laser (XFEL) and energy recovery linac (ERL).