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Polarization-dependent total reflection fluorescence extended X-ray absorption fine structure and its application to supported catalysis

Polarization-dependent total reflection fluorescence-extended X-ray absorption fine structure (PTRF-EXAFS) is a powerful tool to investigate the structures of highly dispersed metal clusters on oxide surfaces that provide a model system for supported metal catalysts. PTRF-EXAFS provides three-dimensional structural information of the dispersed metal clusters, in addition to the metal-support interface structure in the presence of a gas phase. Results from PTRF-EXAFS have revealed that the metal species interacts strongly with surface anions. Finally the future of PTRF-EXAFS is discussed in combination with the next generation light sources, such as X-ray free electron laser (XFEL) and energy recovery linac (ERL).

Publication details

Print publication date
24 Feb 2012
Copyright year
2012
Print ISBN
978-1-84973-375-5
PDF eISBN
978-1-84973-477-6

From the book series:
SPR - Catalysis