Synergistic quantification of trace metal contamination on insulators: a gated fusion framework combining LIBS spectra and event-reconstructed plasma images
Abstract
Alongside conventional salt contamination, metallic particulate deposits on outdoor high-voltage insulators can aggravate pollution-induced flashover, demanding rapid in situ quantification of trace metals. Laser-induced breakdown spectroscopy (LIBS) is well suited for the rapid, in situ multi-element assessment of insulator contamination; however, its quantitative accuracy is often limited by plasma fluctuations and matrix effects. Prior works on insulator contamination reported only moderate calibration performance for several trace metals (e.g., Ni : R2 = 0.773, Cu : R2 = 0.747, and Mn : R2 = 0.615). To address these limitations, a dynamic vision sensor (DVS) is integrated with LIBS to record plasma emission dynamics and generate event-reconstructed plasma images that complement the spectra. Simulated contamination samples were prepared with Ca contents of 10.59–22.47 wt% and trace Fe, Cu and Zn contents of 0.10–0.32, 0.05–0.37 and 0.32–1.24 wt%, respectively, yielding 2000 paired LIBS–DVS measurements. A sample-group-wise leave-one-out cross-validation strategy was adopted to evaluate the generalization to unseen sample groups. GFMT Net combines a transformer spectral encoder, a 2D-CNN image branch, gated feature fusion and multi-task regression for the simultaneous prediction of Ca, Fe, Cu and Zn. Under LOOCV, GFMT Net achieved R2 values of 0.9736, 0.9649, 0.9712 and 0.9741 with RMSEs of 0.5440, 0.0111, 0.0159 and 0.0402 wt%, respectively. Compared with Transformer-LIBS, the best LIBS-only baseline, GFMT Net decreased the RMSEs by 63.28%, 58.10%, 63.41% and 61.24% for Ca, Fe, Cu and Zn, respectively. Ablation and interpretability analyses confirmed that DVS images provided complementary plasma-state information to LIBS spectra. These results demonstrate that event-assisted gated fusion improves robust trace metal quantification on power insulation equipment.

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