All-organic siloxane-strengthening polymer dielectrics for high-temperature capacitive energy storage in harsh-environment electronics

Abstract

Dielectric polymer films often suffer from poor energy-storage levels in harsh-environment electronic devices, circuits and systems. In this work, a molecular engineering strategy is described to synergistically achieve high mechanical strength (321 MPa), breakdown strength (726 MV m−1) and energy density/efficiency (6.5 J cm−3 at η = 90%) at 150 °C in fabricated all-organic siloxane-strengthening polyamide films, whose comprehensive performances present obvious preponderance in the existing polymer dielectrics. It is demonstrated that the coexistence of a strong hydrogen bond, large energy gap and siloxane unit, which specifically reduces interchain interactions in constraint space rather than causing traditionally limitless reduction, synergistically strengthens energy-storage and mechanical performances. Meanwhile, upon confronting harsher partial corona discharge in some particular application scenarios, the copolymerized siloxane unit can generate a SiO2-like structure in situ to effectively resist direct and persistent corona discharge, thereby maintaining high energy-storage levels. This work explores a valuable all-organic design route to synergistically enhance the high-temperature energy storage performance, mechanical strength and partial corona discharge resistance ability of polymer dielectrics, which also presents large-scale production superiority in fabricating high-quality polymer dielectrics for harsh-environment applications in electronics.

Graphical abstract: All-organic siloxane-strengthening polymer dielectrics for high-temperature capacitive energy storage in harsh-environment electronics

Supplementary files

Article information

Article type
Paper
Submitted
09 Apr 2025
Accepted
16 Jun 2025
First published
01 Jul 2025

Energy Environ. Sci., 2025, Advance Article

All-organic siloxane-strengthening polymer dielectrics for high-temperature capacitive energy storage in harsh-environment electronics

X. Li, K. Fan, J. He, S. Sun, Y. Chai, Z. Dang and X. Liu, Energy Environ. Sci., 2025, Advance Article , DOI: 10.1039/D5EE01964H

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