Atomic force microscopy for ferroelectric materials research

Abstract

The behavior of ferroelectric materials is governed by phenomena such as polar surface screening, domain nucleation and growth, and interaction between polarization and defects at the nanoscale. However, traditional macroscopic characterization methods lack spatial resolution to resolve these local phenomena. Atomic force microscopy (AFM) has uniquely filled this gap, evolving from a simple imaging tool into an indispensable platform for both probing and actively manipulating the polarization domain and domain wall. This review encompasses the significant advancements in multimodal AFM, demonstrating how its ability to locally characterize and manipulate them provides fundamental insights. Furthermore, we emphasize the critical role of AFM in validating ferroelectricity in emergent materials, where macroscopic techniques are facing critical challenges. This study provides a comprehensive framework, linking the fundamental physics of nanoscale domains and interfaces to the intrinsic functionality of ferroelectric materials.