Ultrawide bandgap CaHfO3 as a linear dielectric filler for superior energy storage in 0.7Bi0.5Na0.5TiO3-0.3Sr0.7Nd0.2TiO3 ceramics

Abstract

High-power pulsed electronics and compact capacitive storage demand lead-free dielectrics that simultaneously offer high breakdown strength (BDS), energy storage density (Wrec), energy efficiency (η) and stability across frequencies and temperatures. Guided by an ultrawide bandgap assisted design, we incorporate an ultrawide bandgap (∼6 eV) linear dielectric, CaHfO3 (CH), into 0.7Bi0.5Na0.5TiO3-0.3Sr0.7Nd0.2TiO3 (BNT-0.3SNT) to elevate BDS while minimally perturbing the host lattice. Moreover, the high-strength, covalent character of octahedrally coordinated Hf–O bonds is central to stability. BNT-0.3SNT delivers a Wrec of 4.37 J cm−3, whereas the optimized BNT-0.3SNT-0.05CH achieves a BDS of up to 700 kV cm−1, with a Wrec of 8.61 J cm−3 and an η of 83.2%. Moreover, it exhibits excellent frequency stability, with the Wrec varying by only 3.6% over 0.1–200 Hz. Mechanistically, the similarity in ionic radii and valence states between CH and the host matrix helps preserve high saturation polarization; concurrently, grain refinement, bandgap widening, and a reduced oxygen-vacancy concentration act synergistically to enhance the BDS and Wrec. This ultrawide bandgap strategy provides a general design route to high field, fast charge–discharge, lead-free energy storage ceramics for next generation pulsed power systems.

Graphical abstract: Ultrawide bandgap CaHfO3 as a linear dielectric filler for superior energy storage in 0.7Bi0.5Na0.5TiO3-0.3Sr0.7Nd0.2TiO3 ceramics

Supplementary files

Article information

Article type
Paper
Submitted
11 Dec 2025
Accepted
03 Feb 2026
First published
18 Feb 2026

J. Mater. Chem. A, 2026, Advance Article

Ultrawide bandgap CaHfO3 as a linear dielectric filler for superior energy storage in 0.7Bi0.5Na0.5TiO3-0.3Sr0.7Nd0.2TiO3 ceramics

J. Li, J. Du, Q. Feng, S. Li, L. Bao, J. Liao, W. Jiang, X. Chen and C. Yuan, J. Mater. Chem. A, 2026, Advance Article , DOI: 10.1039/D5TA10133F

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