Sulfur-rich polymer with nanoparticles: high refractive index dual-tone photoresist
Abstract
A sulfur-containing polymer was synthesized and the refractive index (RI) reached 1.80 (633 nm) upon incorporation with nano TiO2 particles. Mixtures were formulated as high RI dual-tone photoresists with high transparency by introducing a photoacid generator and crosslinker. The good patterning performance suggests potential applications in optical devices.

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