The Influence of Multiple Ionization and Chemical Effects on Magnesium Kα X-Ray Spectra in High-Resolution Proton and Alpha PIXE Measurements

Abstract

High-resolution wavelength-dispersive (WD) X-ray emission spectra of the Mg Kα band were measured for metallic Mg and selected Mg compounds under excitation with 2–3 MeV proton (H) and 1.5–5 MeV alpha (He) ion beams. The study investigated the influence of chemical state as well as ion beam type and energy on the positions and relative intensities of Mg Kα spectral line components. In addition to the characteristic X-ray emission line, H-induced spectra revealed KL¹ multiple ionization satellite (MIS) lines, while He excitation produced both KL¹ and KL² MIS groups with strong energy-dependent relative intensities. Small but measurable peaks’ energy shifts were observed among different Mg compounds. Statistically significant variations in the relative intensities of KL¹ group’s components, correlating with chemical bonding, were also detected, with He excitation providing enhanced sensitivity for chemical speciation.