Probing the structure of D2O ice layers on ALD-grown ZrO2, Al2O3 and TiO2 thin films by sum frequency generation (SFG) spectroscopy

Abstract

Sum frequency generation (SFG) spectroscopy was applied to investigate D2O adsorption on atomic layer deposition (ALD)-grown Al2O3, ZrO2, and TiO2 films at 94 ± 1 K. Film composition and thickness were characterized by ellipsometry and X-ray photoelectron spectroscopy (XPS). Additional SFG measurements were conducted on the SiO2/Si wafer and on a CoO film prepared by oxidizing Co foil. At D2O exposure below 3000 L, the spectra were dominated by interfacial features originating from the ice–oxide interface. These spectra exhibited a weak, broad O–D stretching band (OD3) centered at 2650 cm−1, tentatively attributed to (dissociated) water molecules hydrogen-bonded to the oxide surface; this assignment was supported by the absence of the OD3 feature on the SiO2/Si substrate. A sharp peak at 2730 cm−1 was also observed and assigned to the “free” O–D stretch (non-hydrogen-bonded with any neighboring molecule) of surface D2O molecules pointing into the vapor phase. Upon increasing D2O exposure, both the OD3 and “free” OD bands decreased in intensity and were replaced by weakly hydrogen-bonded OD2 and strongly hydrogen-bonded OD1 modes associated with the ice–vapor interface. As the exposure increased further, the OD2 and OD1 bands shifted to lower wavenumbers (2310 to 2284 cm−1) and became stronger, with the OD1 mode exhibiting a larger red shift and more pronounced intensity enhancement. No significant differences in water structure were observed on the Al2O3, ZrO2, and CoO films at the ice–vapor interfaces, apart from an approximately fivefold reduction in intensity on CoO, which is attributed to signal scattering from the rough CoO film/Co foil surface. However, when D2O exposure reached ≥30 000 L, the OD1 band on the TiO2 surfaces decreased substantially in intensity and shifted to much lower wavenumbers (2065 cm−1 at 30 000 L; 2030 cm−1 at 102 000 L) than on Al2O3 (2283 cm−1 at 90 000 L), ZrO2 (2293 cm−1 at 30 000 L), and CoO (2284 cm−1 at 900 000 L), indicating specific hydrogen-bonding interactions on the TiO2 surface.

Graphical abstract: Probing the structure of D2O ice layers on ALD-grown ZrO2, Al2O3 and TiO2 thin films by sum frequency generation (SFG) spectroscopy

Supplementary files

Article information

Article type
Paper
Submitted
06 Dec 2025
Accepted
16 Dec 2025
First published
16 Dec 2025
This article is Open Access
Creative Commons BY license

Faraday Discuss., 2026, Advance Article

Probing the structure of D2O ice layers on ALD-grown ZrO2, Al2O3 and TiO2 thin films by sum frequency generation (SFG) spectroscopy

X. Li, S. Gross, T. Haunold, M. Jang, M. Zukalova, M. Jindra, J. E. Olszówka, Y. Lei, Š. Vajda and G. Rupprechter, Faraday Discuss., 2026, Advance Article , DOI: 10.1039/D5FD00152H

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