Universal non-destructive interconnection layer engineering for efficient and stable perovskite tandem photovoltaics

Jiandong He; Jianan Wang; He Zhu; Ruihan Wu; Xuepeng Chen; Dongni Li; Youyu Jiang; Keli Wang; Changling Zhan; Peng Gao; Yabin Ma; Rui Zhu; Jing Li; Chengbo Tian; Zhanhua Wei; Lei Meng; Yinhua Zhou; Wei Chen; Yicheng Zhao; Zonghao Liu; Qing Zhao

doi:10.1039/D5EE06282A

Universal non-destructive interconnection layer engineering for efficient and stable perovskite tandem photovoltaics

Jiandong He,†^abg Jianan Wang,†^c He Zhu,†^c Ruihan Wu,†^bg Xuepeng Chen,^a Dongni Li,^d Youyu Jiang,^c Keli Wang,

^ae Changling Zhan,^a Peng Gao,^a Yabin Ma,^a Rui Zhu,

^ah Jing Li,^f Chengbo Tian,

^h Zhanhua Wei,

^h Lei Meng,

^bg Yinhua Zhou,

^c Wei Chen,^c Yicheng Zhao,*^d Zonghao Liu*^c and Qing Zhao

*^ai

Author affiliations

* Corresponding authors

^a State Key Lab for Mesoscopic Physics and Frontiers Science Center for Nano-optoelectronics, School of Physics, Peking University, Beijing, China
E-mail: zhaoqing@pku.edu.cn

^b Beijing National Laboratory for Molecular Sciences, CAS Key Laboratory of Organic Solids, Institute of Chemistry, Chinese Academy of Sciences, Beijing, China

^c Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information, Huazhong University of Science and Technology, Luoyu Road 1037, Wuhan 430074, Hubei, China
E-mail: liuzonghao@hust.edu.cn

^d State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Integrated Circuit Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China
E-mail: zhaoyicheng@uestc.edu.cn

^e Institute of Atomic and Molecular Physics, Sichuan University, Chengdu, China

^f Key Laboratory of Photochemical Conversion and Optoelectronic Materials, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing 100190, China

^g University of Chinese Academy of Sciences, Beijing, China

^h Institute of Luminescent Materials and Information Displays, College of Materials Science and Engineering, Huaqiao University, Xiamen 361021, China

ⁱ Peking University Yangtze Delta Institute of Optoelectronics, Nantong, Jiangsu, China

Abstract

Aqueous poly(3,4-ethylenedioxythiophene):polystyrenesulfonate (PEDOT:PSS) solution, universally employed on the interconnection layer (ICL) in all-perovskite and perovskite/organic tandem cells, has the intrinsic risk of perovskite instability induced by moisture erosion. Here we identify the root cause of instabilities caused by conventional PEDOT:PSS. Moisture from the aqueous formulation penetrates downward through the ICL during device fabrication, chemically degrading the underlying wide-bandgap perovskite and irreversibly reducing device efficiency and stability. We replaced PEDOT:PSS with an isopropanol (IPA)-dispersible PEDOT. This stable hole transport material eliminates moisture-induced damage while maintaining uniform, non-destructive coverage on the ICL, effectively resolving the long-standing limitations of aqueous PEDOT:PSS. In addition, the introduction of IPA-dispersible PEDOT reduces buried interfacial recombination in the narrow bandgap tin-lead perovskites and improves hole extraction. As a result, all-perovskite tandem cells achieved power conversion efficiencies of 29.7% (certified 29.6%) and perovskite/organic tandem cells achieved a PCE of 26.5%, and retained 90% of initial performance under continuous 1-sun operation for over 534 hours and 403 h, respectively, demonstrating their universal applicability and reliability for efficient and stable perovskite tandem photovoltaics.

Energy & Environmental Science

Universal non-destructive interconnection layer engineering for efficient and stable perovskite tandem photovoltaics

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Universal non-destructive interconnection layer engineering for efficient and stable perovskite tandem photovoltaics

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