In situ x-ray-based spectroscopy techniques for the characterization of solid-gas interface in nanostructures: what is next?

Abstract

In situ spectroscopy measurements changed the way of scientists analyzing nanostructures in different fields like catalysis, electrochemistry, energy production and storage, among others. The exciting and impactfull results found with in situ spectroscopy measurements over the years demonstrated new atomic phenomena shedding light on the complex events existing in the nanoworld. This method is already well stablished and used in a variety of interfaces like solid-gas, solid-liquid, and liquid-gas, but it keeps evolving to more sophisticated experiments that are needed to address the current scientific challenges. In this perspective, a brief overview of the evolution of in situ measurements of solid-gas interfaces is given followed by modern experiments and procedures currently coupled to in situ methods and some important challenges. At the end, future targets of in situ measurements are presented and discussed.