Issue 20, 2025
From the journal:

RSC Advances

Retraction: Structural, morphological, electrical, and dielectric properties of Na2Cu5(Si2O7)2 for ASSIBs

Mohamed Ben Bechir*a  and  Mehdi Akermibc  

* Corresponding authors

a Laboratory of Spectroscopic and Optical Characterization of Materials (LaSCOM), Faculty of Sciences, University of Sfax, 3000 Sfax, Tunisia
E-mail: mohamedbenbechir@hotmail.com

b Department Physics, College of Sciences, Jazan University, P. O. Box. 114, Jazan, Kingdom of Saudi Arabia
E-mail: makermi@jazanu.edu.sa

c Laboratory of Interfaces and Advanced Materials, Faculty of Science, Boulevard of the Environment, University of Monastir, Monastir, Tunisia

Abstract

Retraction of ‘Structural, morphological, electrical, and dielectric properties of Na2Cu5(Si2O7)2 for ASSIBs’ by Mohamed Ben Bechir et al., RSC Adv., 2024, 14, 9228–9242, https://doi.org/10.1039/D4RA01454E.

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Article information

DOI
https://doi.org/10.1039/D5RA90057C
Article type
Retraction
Submitted
07 May 2025
Accepted
07 May 2025
First published
14 May 2025
This article is Open Access
Creative Commons BY license

RSC Adv., 2025,15, 16097-16097

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Retraction: Structural, morphological, electrical, and dielectric properties of Na2Cu5(Si2O7)2 for ASSIBs

M. Ben Bechir and M. Akermi, RSC Adv., 2025, 15, 16097 DOI: 10.1039/D5RA90057C

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