Deep learning for augmented process monitoring of scalable perovskite thin-film fabrication†
Abstract
Reproducible large-area fabrication is one of the remaining challenges for the commercialization of perovskite photovoltaics. Imaging methods augmented with deep learning (DL) enable in-line detection of spatial or temporal inconsistencies and predict the impact of observed changes on device performance. In this work, we showcase three use cases of how DL augments complex experimental data analysis of the large-area perovskite thin film formation, even on moderate-sized datasets. First, we demonstrate material composition monitoring by differentiating between precursor property variations, ensuring material consistency during fabrication. Second, we provide early thin-film quality assessment by predicting holistic device performance even before its finalization. Finally, we extend the approach from parameter prediction to generating recommendations for process control by forecasting monitoring signals as a function of a variable process parameter and predicting the corresponding device performances. By addressing tasks that are hardly possible for humans to solve, we present how DL augments data analysis by transforming experimental data into predictions of target parameters.