Improved droplet elongation model and value for surface tension of AuSi

Abstract

Surface tension is crucial for nanowire vapor liquid solid (VLS) growth models and simulations of growth under external stimuli. A promising method involving imaging droplet deformation under an external electric field has previously been used to report the surface tension of the AuSi eutectic catalyst on Si-nanowires. However, simplified assumptions in this approach led to a significantly lower value than those previously reported. In this study, we re-analyze the same dataset using a comprehensive three-dimensional (3D) model that accurately represents the hexagonal cross-section of Si nanowires. This approach provides a corrected surface tension value of 0.74 ± 0.26 J m⁻² consistent with other findings in the literature, and notably higher than the previously reported value of 0.55 ± 0.1 J m⁻². Our result highlights the importance of precise geometric modeling in accurately determining surface tension and enhancing the reliability of nanowire growth simulations and eutectic alloy studies.