Issue 36, 2024

Interlayer sliding induced antiferroelectricity–ferroelectricity–antiferroelectricity transition in bilayer δ-SiX (X = S/Se)

Abstract

Two-dimensional (2D) sliding ferroelectric materials possess intriguing physical and electronic properties, thereby greatly expanding the family of 2D ferroelectrics (FEs). In this work, using first-principles calculations, we demonstrate a reversible antiferroelectricity–ferroelectricity–antiferroelectricity (AFE–FE–AFE) transition in bilayer δ-SiX (X = S/Se) along the in-plane direction during interlayer sliding. This transition primarily stems from the mechanical sliding of the top layer. Notably, spontaneous polarization (Ps) can reach up to approximately 80 pC m−1 and 70 pC m−1 for bilayers SiS and SiSe, respectively. Furthermore, the mechanism underlying this phase transition involves the interlayer between interaction energy (Einter) and strain energy (Eε). In the case of bilayer SiS, along the ABAFE–AAFE–ABAFE path, critical points arise from the cooperation of strain energy and mechanical sliding force. During the ACAFE–ADFE sliding process, phase transition relies on the combined effect of strain energy and mechanical sliding force. At the ADFE–ACAFE point, the transition is primarily driven by the combined action of interlayer interaction energy and mechanical sliding force. This theoretical work not only establishes a feasible approach for achieving a reversible AFE–FE–AFE phase transition, but also offers valuable insights for the design of novel volatile devices.

Graphical abstract: Interlayer sliding induced antiferroelectricity–ferroelectricity–antiferroelectricity transition in bilayer δ-SiX (X = S/Se)

Supplementary files

Article information

Article type
Paper
Submitted
22 Mar 2024
Accepted
30 Jul 2024
First published
31 Jul 2024

J. Mater. Chem. C, 2024,12, 14387-14394

Interlayer sliding induced antiferroelectricity–ferroelectricity–antiferroelectricity transition in bilayer δ-SiX (X = S/Se)

Z. Qu, X. Wang, J. Zhang, S. Jiang, Z. Xu, F. Yang, Z. Wu, Y. Dai and Y. Zhu, J. Mater. Chem. C, 2024, 12, 14387 DOI: 10.1039/D4TC01133C

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