Issue 47, 2024

Controlling TiO2 photocatalytic behaviour via perhydropolysilazane-derived SiO2 ultrathin shell

Abstract

This study addresses the inherent photocatalytic activity of pure titanium dioxide (TiO2), which limits its application as an industrial pigment. To mitigate this issue, a core–shell structure was employed, where TiO2 cores were encapsulated within SiO2 shells. Perhydropolysilazane (PHPS) was introduced as a superior SiO2 precursor over tetraethylorthosilicate (TEOS), resulting in thinner and more uniform SiO2 shells. Utilizing TiO2's photocatalytic properties, hydroxyl radicals facilitated the conversion of PHPS into SiO2via native Si–H bonds, eliminating the need for additional reducing agents. The formation of PHPS-derived TiO2@SiO2 core–shell nanoparticles demonstrated inherent self-limiting behaviour, ensuring uniform shell thickness regardless of PHPS concentration, simplifying the process for large-scale industrial applications compared to TEOS, which demands precise parameter control. Photocatalytic evaluations highlighted significant passivation of TiO2 photocatalytic activity by PHPS-derived TiO2@SiO2 core–shell particles and TiO2/SiO2 thin films. Specifically, TiO2@PHPS nanoparticles achieved 89–96% passivation compared to 30% with TiO2@TEOS, while TiO2/PHPS films degraded only 12% of Eosin B versus 80% with TiO2 films. Moreover, both PHPS-derived nanoparticles and films maintained TiO2's inherent high whiteness and high-refractive-index optical properties, underscoring their suitability for applications in white paint production, cosmetics, and high-refractive-index coatings.

Graphical abstract: Controlling TiO2 photocatalytic behaviour via perhydropolysilazane-derived SiO2 ultrathin shell

Supplementary files

Article information

Article type
Paper
Submitted
31 Aug 2024
Accepted
04 Nov 2024
First published
05 Nov 2024
This article is Open Access
Creative Commons BY license

Nanoscale, 2024,16, 21960-21969

Controlling TiO2 photocatalytic behaviour via perhydropolysilazane-derived SiO2 ultrathin shell

D. Burak, J. H. Han, J. S. Han, I. S. Kim, M. A. Rahman, J. K. W. Yang and S. Cho, Nanoscale, 2024, 16, 21960 DOI: 10.1039/D4NR03566F

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