Issue 30, 2022

Controllable Schottky barriers and contact types of BN intercalation layers in graphene/MoSi2As4 vdW heterostructures via applying an external electrical field

Abstract

Graphene-based van der Waals (vdW) heterostructures have opened unprecedented opportunities for various device applications due to their rich functionalities and novel physical properties. Motivated by the successful synthesis of a MoSi2N4 monolayer (Science, 2020, 369, 670), in this work by means of first-principles calculations we construct and investigate the interfacial electronic properties of the graphene/MoSi2As4 vdW heterostructure, which is expected to be energetically favorable and stable. Our results show that the graphene/MoSi2As4 heterostructure forms an n-type Schottky contact with a low barrier of 0.12 eV, which is sensitive to the external electric field and the transformation from an n-type Schottky contact to a p-type one can be achieved at 0.2 V Å−1. The small effective masses and strong optical absorption intensity indicate that the graphene/MoSi2As4 heterostructure will have a high carrier mobility and can be applied to high-speed FET. Importantly, we also show that the opening band gap can be achieved in the graphene/BN/MoSi2As4 heterostructure and the type-I band alignment can transform into type-II under an external electric field of −0.2 V Å−1. These findings demonstrate that the graphene/MoSi2As4 heterostructure can be considered as a promising candidate for high-efficiency Schottky nanodevices.

Graphical abstract: Controllable Schottky barriers and contact types of BN intercalation layers in graphene/MoSi2As4 vdW heterostructures via applying an external electrical field

Supplementary files

Article information

Article type
Paper
Submitted
03 May 2022
Accepted
14 Jul 2022
First published
16 Jul 2022

Phys. Chem. Chem. Phys., 2022,24, 18331-18339

Controllable Schottky barriers and contact types of BN intercalation layers in graphene/MoSi2As4 vdW heterostructures via applying an external electrical field

Y. Guo, Y. Dong, X. Cai, L. Liu and Y. Jia, Phys. Chem. Chem. Phys., 2022, 24, 18331 DOI: 10.1039/D2CP02011D

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