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X-ray detection plays an extremely significant function in medical diagnosis, nondestructive testing, safety testing, scientific research, environmental monitoring and other practical applications. However, conventional inorganic semiconductors, such as amorphous selenium, crystalline Si and pure Ge present almost uncontrollable bandgaps and require quite sophisticated fabrication techniques despite their outstanding performance. As developing materials for direct conversion X-ray detection, halide perovskite semiconductors exhibit remarkable properties with high sensitivity. In this review, we summarize the optoelectronic performance of different dimensional perovskites in X-ray detection and their application in X-ray imaging for perovskite-based X-ray detectors including single crystals, films and wafers. This review aims to preliminarily highlight the relationship between structural dimensionality and X-ray detection properties, which should provide valuable suggestions for researchers to rationally design high-performance halide perovskite X-ray photodetectors through crystal engineering at the molecular level in the future.

Graphical abstract: Applications of halide perovskites in X-ray detection and imaging

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