Stable field-emission from a CeB6 nanoneedle point electron source

Abstract

A single CeB₆ nanoneedle structure has been fabricated using a focused ion beam (FIB) and its field emission characteristics have been evaluated. A converged electron beam has been obtained, attributed to its sharpened tip with a radius of curvature of about 10 nm. Combined with its low work function, the required electric field is as low as 1.6 V nm⁻¹ to generate a field emission current of 50 nA. The most outstanding feature of the CeB₆ nanoneedle emitter is its excellent current stability that enabled continuous emission for 16 hours with a fluctuation of 1.6% and without deterioration even in a vacuum of 10⁻⁷ Pa. The stable field-emission is attributed to the nanometric tip radius that led to reduction in gas adsorption and desorption. In addition, the downward dipolar structure on the emission surface is also beneficial for making the surface inert. These performance factors make CeB₆ a practical field-emission point electron source for microscopy applications.