Jump to main content
Jump to site search

Issue 3, 2021
Previous Article Next Article

Dynamic degradation of metallic nanowire networks under electrical stress: a comparison between experiments and simulations

Author affiliations

Abstract

Metallic nanowire networks represent a promising solution for a new generation of transparent and flexible devices, including touch screens, solar cells and transparent heaters. They, however, lack stability under thermal and electrical stresses, often leading to the degradation of nanowires, which results in the loss of electrical percolation paths. We propose a comprehensive description of the degradation mechanism in a metallic nanowire network subjected to electrical stress. The nanowire network degradation is ascribed, at a very local scale, to the hot-spot formation and the subsequent propagation of a spatially correlated disruptive crack. We compare the behaviour of actual networks under electrical and thermal stresses to dynamic simulations of randomly deposited sticks on a 2D surface, and a thermal phenomenon simulated in a metal thin film. On one hand, such comparison allows us to deduce an average junction resistance between nanowires. On the other hand, we observed that initial flaws in a discrete network result in a local current density increase in the surrounding area, further leading to an amplified Joule effect. This phenomenon promotes the spatial correlation in the damage of the percolating network. Such non-reversible failure of the transparent electrode is in good agreement with experimental observations.

Graphical abstract: Dynamic degradation of metallic nanowire networks under electrical stress: a comparison between experiments and simulations

Back to tab navigation

Article information


Submitted
26 Oct 2020
Accepted
30 Nov 2020
First published
08 Dec 2020

This article is Open Access

Nanoscale Adv., 2021,3, 675-681
Article type
Paper

Dynamic degradation of metallic nanowire networks under electrical stress: a comparison between experiments and simulations

N. Charvin, J. Resende, D. T. Papanastasiou, D. Muñoz-Rojas, C. Jiménez, A. Nourdine, D. Bellet and L. Flandin, Nanoscale Adv., 2021, 3, 675
DOI: 10.1039/D0NA00895H

This article is licensed under a Creative Commons Attribution-NonCommercial 3.0 Unported Licence. Material from this article can be used in other publications provided that the correct acknowledgement is given with the reproduced material and it is not used for commercial purposes.

Reproduced material should be attributed as follows:

  • For reproduction of material from NJC:
    [Original citation] - Published by The Royal Society of Chemistry (RSC) on behalf of the Centre National de la Recherche Scientifique (CNRS) and the RSC.
  • For reproduction of material from PCCP:
    [Original citation] - Published by the PCCP Owner Societies.
  • For reproduction of material from PPS:
    [Original citation] - Published by The Royal Society of Chemistry (RSC) on behalf of the European Society for Photobiology, the European Photochemistry Association, and RSC.
  • For reproduction of material from all other RSC journals:
    [Original citation] - Published by The Royal Society of Chemistry.

Information about reproducing material from RSC articles with different licences is available on our Permission Requests page.


Social activity

Search articles by author

Spotlight

Advertisements