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Volume 228, 2021

Multi-channel photodissociation and XUV-induced charge transfer dynamics in strong-field-ionized methyl iodide studied with time-resolved recoil-frame covariance imaging

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Abstract

The photodissociation dynamics of strong-field ionized methyl iodide (CH3I) were probed using intense extreme ultraviolet (XUV) radiation produced by the SPring-8 Angstrom Compact free electron LAser (SACLA). Strong-field ionization and subsequent fragmentation of CH3I was initiated by an intense femtosecond infrared (IR) pulse. The ensuing fragmentation and charge transfer processes following multiple ionization by the XUV pulse at a range of pump–probe delays were followed in a multi-mass ion velocity-map imaging (VMI) experiment. Simultaneous imaging of a wide range of resultant ions allowed for additional insight into the complex dynamics by elucidating correlations between the momenta of different fragment ions using time-resolved recoil-frame covariance imaging analysis. The comprehensive picture of the photodynamics that can be extracted provides promising evidence that the techniques described here could be applied to study ultrafast photochemistry in a range of molecular systems at high count rates using state-of-the-art advanced light sources.

Graphical abstract: Multi-channel photodissociation and XUV-induced charge transfer dynamics in strong-field-ionized methyl iodide studied with time-resolved recoil-frame covariance imaging

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Supplementary files

Article information


Submitted
05 Oct 2020
Accepted
13 Nov 2020
First published
18 Nov 2020

Faraday Discuss., 2021,228, 571-596
Article type
Paper

Multi-channel photodissociation and XUV-induced charge transfer dynamics in strong-field-ionized methyl iodide studied with time-resolved recoil-frame covariance imaging

F. Allum, N. Anders, M. Brouard, P. Bucksbaum, M. Burt, B. Downes-Ward, S. Grundmann, J. Harries, Y. Ishimura, H. Iwayama, L. Kaiser, E. Kukk, J. Lee, X. Liu, R. S. Minns, K. Nagaya, A. Niozu, J. Niskanen, J. O’Neal, S. Owada, J. Pickering, D. Rolles, A. Rudenko, S. Saito, K. Ueda, C. Vallance, N. Werby, J. Woodhouse, D. You, F. Ziaee, T. Driver and R. Forbes, Faraday Discuss., 2021, 228, 571 DOI: 10.1039/D0FD00115E

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