Quantitative measurement of charge accumulation along a quasi-one-dimensional W5O14 nanowire during electron field emission

Fengshan Zheng; Giulio Pozzi; Vadim Migunov; Luka Pirker; Maja Remškar; Marco Beleggia; Rafal E. Dunin-Borkowski

doi:10.1039/D0NR00739K

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Quantitative measurement of charge accumulation along a quasi-one-dimensional W₅O₁₄ nanowire during electron field emission†

Fengshan Zheng,

*^a Giulio Pozzi,^ab Vadim Migunov,^c Luka Pirker,^d Maja Remškar,^d Marco Beleggia^e and Rafal E. Dunin-Borkowski^a

Author affiliations

* Corresponding authors

^a Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, 52425 Jülich, Germany
E-mail: f.zheng@fz-juelich.de

^b Department of Physics and Astronomy, University of Bologna, Viale Berti Pichat 6/2, 40127 Bologna, Italy

^c Central Facility for Electron Microscopy (GFE), RWTH Aachen University, Ahornstrasse 55, 52074 Aachen, Germany

^d Jozef Stefan Institute, Solid-State Physics Department, Jamova 39, SLO-1000 Ljubljana, Slovenia

^e DTU Nanolab, Technical University of Denmark, 2800 Kgs. Lyngby, Denmark

Abstract

We use an electron holographic method to determine the charge distribution along a quasi-one-dimensional W₅O₁₄ nanowire during in situ field emission in a transmission electron microscope. The results show that the continuous charge distribution along the nanowire is not linear, but that there is an additional accumulation of charge at its apex. An analytical expression for this additional contribution to the charge distribution is proposed and its effect on the field enhancement factor and emission current is discussed.

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Article information

DOI: https://doi.org/10.1039/D0NR00739K
Article type: Paper
Submitted: 27 Jan 2020
Accepted: 06 Mar 2020
First published: 06 Mar 2020
This article is Open Access

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Nanoscale, 2020,12, 10559-10564

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Quantitative measurement of charge accumulation along a quasi-one-dimensional W₅O₁₄ nanowire during electron field emission

F. Zheng, G. Pozzi, V. Migunov, L. Pirker, M. Remškar, M. Beleggia and R. E. Dunin-Borkowski, Nanoscale, 2020, 12, 10559 DOI: 10.1039/D0NR00739K

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