Jump to main content
Jump to site search


Three-dimensional near-field analysis through peak force scattering-type near-field optical microscopy

Author affiliations

Abstract

Scattering-type scanning near-field optical microscopy (s-SNOM) is instrumental in exploring polaritonic behaviors of two-dimensional (2D) materials at the nanoscale. A sharp s-SNOM tip couples momenta into 2D materials through phase matching to excite phonon polaritons, which manifest as nanoscale interference fringes in raster images. However, s-SNOM lacks the ability to detect the progression of near-field properties along the perpendicular axis to the surface. Here, we perform near-field analysis of a micro-disk and a reflective edge made of isotopically pure hexagonal boron nitride (h-11BN), by using three-dimensional near-field response cubes obtained by peak force scattering-type near-field optical microscopy (PF-SNOM). Momentum quantization of polaritons from the confinement of the circular structure is revealed in situ. Moreover, tip–sample distance is found to be capable of fine-tuning the momentum of polaritons and modifying the superposition of quantized polaritonic modes. The PF-SNOM-based three-dimensional near-field analysis provides detailed characterization capability with a high spatial resolution to fully map three-dimensional near-fields of nano-photonics and polaritonic structures.

Graphical abstract: Three-dimensional near-field analysis through peak force scattering-type near-field optical microscopy

Back to tab navigation

Supplementary files

Article information


Submitted
30 Sep 2019
Accepted
20 Dec 2019
First published
20 Dec 2019

Nanoscale, 2020, Advance Article
Article type
Paper

Three-dimensional near-field analysis through peak force scattering-type near-field optical microscopy

H. Wang, J. Li, J. H. Edgar and X. G. Xu, Nanoscale, 2020, Advance Article , DOI: 10.1039/C9NR08417G

Social activity

Search articles by author

Spotlight

Advertisements