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Negative electrocaloric effect in antiferroelectric zirconium dioxide thin film

Abstract

Huge negative electrocaloric effect is demonstrated in antiferroelectric ZrO2 thin film deposited byatomic layer deposition with 8nm in thickness. Adiabatic temperature change as high as∆T=−31K is obtained for an electric field change of∆E=3.45MV cm−1 at an ambient temperatureof 413K. Moreover, the ZrO2 thin film shows enhanced stability as demonstrated by enduranceand Preisach density maps. Due to its high phase transition temperature and thermal stability, itshigh scalability and full CMOS compatibility, ZrO2 is proposed as a promising candidate for futuremultilayer electrocaloric and solid-state cooling devices.

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Article information


Submitted
23 Aug 2019
Accepted
03 Jan 2020
First published
03 Jan 2020

Nanoscale, 2020, Accepted Manuscript
Article type
Paper

Negative electrocaloric effect in antiferroelectric zirconium dioxide thin film

B. Allouche, H. J. Hwang, T. J. Yoo and B. H. Lee, Nanoscale, 2020, Accepted Manuscript , DOI: 10.1039/C9NR07293D

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