Carrier dynamic monitoring of a π-conjugated polymer: a surface-enhanced Raman scattering method†
Here, the carrier dynamics of a π-conjugated polymer is monitored by voltage-dependent surface-enhanced Raman scattering (SERS). The conductive polymer poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS) is employed as a metal-free SERS substrate. Under different voltage conditions, the SERS performance of the semiconductors’ rectification characteristic is discussed. Our results open an unprecedented regime for conducting polymer-based SERS.