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Issue 3, 2020
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Nanodiamonds as a state-of-the-art material for enhancing the gamma radiation resistance properties of polymeric membranes

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Abstract

We report, for the first time, the development of gamma radiation resistant polysulfone (Psf)–nanodiamond (ND) composite membranes with varying concentrations of NDs, ranging up to 2 wt% of Psf. Radiation stability of the synthesized membranes was tested up to a dose of 1000 kGy. To understand the structure–property correlationship of these membranes, multiple characterization techniques were used, including field-emission scanning electron microscopy, atomic force microscopy, drop shape analysis, Fourier-transform infrared spectroscopy, X-ray photoelectron spectroscopy, gel permeation chromatography, positron annihilation spectroscopy, and small angle X-ray scattering. All the composite membranes exhibited enhanced radiation resistance properties, with 0.5% loading of NDs as the optimum. Compared to the radiation stability of Psf membranes up to a dose of 100 kGy, the optimum composite membranes are found to be stable up to a radiation dose of 500 kGy, owing to the unique surface chemistry of NDs and interfacial chemistry of Psf–ND composites. Experimental findings along with the Monte Carlo simulation studies confirmed a five times enhanced life-span of the composite membranes in an environment of the intermediate level radioactive waste, compared to the control Psf membrane.

Graphical abstract: Nanodiamonds as a state-of-the-art material for enhancing the gamma radiation resistance properties of polymeric membranes

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Supplementary files

Article information


Submitted
13 Jun 2019
Accepted
29 Jan 2020
First published
31 Jan 2020

This article is Open Access

Nanoscale Adv., 2020,2, 1214-1227
Article type
Paper

Nanodiamonds as a state-of-the-art material for enhancing the gamma radiation resistance properties of polymeric membranes

A. Bedar, N. Goswami, A. K. Singha, V. Kumar, A. K. Debnath, D. Sen, V. K. Aswal, S. Kumar, D. Dutta, B. Keshavkumar, S. Ghodke, R. Jain, B. G. Singh, P. K. Tewari, R. C. Bindal and S. Kar, Nanoscale Adv., 2020, 2, 1214
DOI: 10.1039/C9NA00372J

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