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Issue 30, 2020
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Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

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Abstract

We use microcrystal electron diffraction (MicroED) to determine structures of three organic semiconductors, and show that these structures can be used along with grazing-incidence wide-angle X-ray scattering (GIWAXS) to understand crystal packing and orientation in thin films. Together these complimentary techniques provide unique structural insights into organic semiconductor thin films, a class of materials whose device properties and electronic behavior are sensitively dependent on solid-state order.

Graphical abstract: Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

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Submitted
07 Jan 2020
Accepted
06 Mar 2020
First published
07 Mar 2020

Chem. Commun., 2020,56, 4204-4207
Article type
Communication

Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

A. M. Levine, G. Bu, S. Biswas, E. H. R. Tsai, A. B. Braunschweig and B. L. Nannenga, Chem. Commun., 2020, 56, 4204
DOI: 10.1039/D0CC00119H

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