Jump to main content
Jump to site search

Issue 3, 2019
Previous Article Next Article

Enhanced efficiency in perovskite solar cells by eliminating the electron contact barrier between the metal electrode and electron transport layer

Author affiliations

Abstract

Interface modifying layers (IMLs) play a pivotal role in the improved performance of perovskite solar cells (PSCs). Herein, we report a new IML based on Bphen:Cs2CO3:BCP (BCB), which is inserted at the interface of phenyl-C61-butyric acid methyl ester (PC61BM) and a Ag electrode. Consequently, the efficiency of PSCs is significantly improved by 5% (from 17.57% to 18.29%), mainly due to the increased open circuit voltage (VOC). It is revealed by ultraviolet photoelectron spectroscopy (UPS) that the work function of Ag is reduced from 4.68 eV to 3.90 eV, after being modified by BCB due to the formation of a strong negative interfacial dipole at the Ag/BCB interface. The decreased work function of Ag improves the ohmic contact between PC61BM and Ag, facilitating carrier extraction and suppressing the charge recombination at the interface of PC61BM and the Ag electrode. As a result, the reverse saturation current of the final PSC is decreased by approximately one order of magnitude, which is consistent with a larger VOC. Our work provides a comprehensive understanding of the interface between a metal electrode and an electron transporting layer (ETL), and hence paves a way towards better interfacial engineering and highly efficient solar cells.

Graphical abstract: Enhanced efficiency in perovskite solar cells by eliminating the electron contact barrier between the metal electrode and electron transport layer

Back to tab navigation

Supplementary files

Publication details

The article was received on 05 Nov 2018, accepted on 11 Dec 2018 and first published on 13 Dec 2018


Article type: Paper
DOI: 10.1039/C8TA10630D
Citation: J. Mater. Chem. A, 2019,7, 1349-1355
  •   Request permissions

    Enhanced efficiency in perovskite solar cells by eliminating the electron contact barrier between the metal electrode and electron transport layer

    J. Tao, N. Ali, K. Chen, Z. Huai, Y. Sun, G. Fu, W. Kong and S. Yang, J. Mater. Chem. A, 2019, 7, 1349
    DOI: 10.1039/C8TA10630D

Search articles by author

Spotlight

Advertisements