Issue 10, 2019

Spatially resolved mapping of phase transitions in liquid-crystalline materials by X-ray birefringence imaging

Abstract

The X-ray Birefringence Imaging (XBI) technique, first reported in 2014, is a sensitive method for spatially resolved mapping of the local orientational properties of anisotropic materials. We report the first application of the XBI technique to characterize molecular orientational ordering in a liquid crystalline material, demonstrating significant potential for exploiting XBI measurements to advance structural understanding of liquid crystal phases.

Graphical abstract: Spatially resolved mapping of phase transitions in liquid-crystalline materials by X-ray birefringence imaging

Supplementary files

Article information

Article type
Edge Article
Submitted
27 Nov 2018
Accepted
21 Dec 2018
First published
02 Jan 2019
This article is Open Access

All publication charges for this article have been paid for by the Royal Society of Chemistry
Creative Commons BY license

Chem. Sci., 2019,10, 3005-3011

Spatially resolved mapping of phase transitions in liquid-crystalline materials by X-ray birefringence imaging

Y. Zhou, R. Patterson, B. A. Palmer, G. R. Edwards-Gau, Benson M. Kariuki, N. S. S. Kumar, D. W. Bruce, I. P. Dolbnya, S. P. Collins, A. Malandain and K. D. M. Harris, Chem. Sci., 2019, 10, 3005 DOI: 10.1039/C8SC05285A

This article is licensed under a Creative Commons Attribution 3.0 Unported Licence. You can use material from this article in other publications without requesting further permissions from the RSC, provided that the correct acknowledgement is given.

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