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Issue 10, 2019
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Spatially resolved mapping of phase transitions in liquid-crystalline materials by X-ray birefringence imaging

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Abstract

The X-ray Birefringence Imaging (XBI) technique, first reported in 2014, is a sensitive method for spatially resolved mapping of the local orientational properties of anisotropic materials. We report the first application of the XBI technique to characterize molecular orientational ordering in a liquid crystalline material, demonstrating significant potential for exploiting XBI measurements to advance structural understanding of liquid crystal phases.

Graphical abstract: Spatially resolved mapping of phase transitions in liquid-crystalline materials by X-ray birefringence imaging

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Publication details

The article was received on 27 Nov 2018, accepted on 21 Dec 2018 and first published on 02 Jan 2019


Article type: Edge Article
DOI: 10.1039/C8SC05285A
Citation: Chem. Sci., 2019,10, 3005-3011
  • Open access: Creative Commons BY license
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    Spatially resolved mapping of phase transitions in liquid-crystalline materials by X-ray birefringence imaging

    Y. Zhou, R. Patterson, B. A. Palmer, G. R. Edwards-Gau, Benson M. Kariuki, N. S. S. Kumar, D. W. Bruce, I. P. Dolbnya, S. P. Collins, A. Malandain and K. D. M. Harris, Chem. Sci., 2019, 10, 3005
    DOI: 10.1039/C8SC05285A

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