Jump to main content
Jump to site search


Local scale structural changes of working OFET devices

Author affiliations

Abstract

We present an in situ nanobeam grazing-incidence X-ray diffraction (nanoGIXD) study of real-sized organic field effect transistors (OFET) under applied voltage. The nano-sized beam allows for spatially resolved monitoring of the structural behavior across the poly(3-hexylthiophene) (P3HT) polymer channel and the interfacial regions of the source and drain gold electrodes before and after the operation cycle. We observe major alterations of the gold contacts, in particular diffusion of Au atoms into the polymer channel and a local reorientation of the recrystallized Au nanocrystallites quantified by Hermans’ orientation factors. Therefore, the initially sharp electrode-polymer interfaces are significantly modified as a result of device operation. Our findings demonstrate that nanoGIXD has a high potential to probe functionality and reliability of working organic devices.

Graphical abstract: Local scale structural changes of working OFET devices

Back to tab navigation

Supplementary files

Publication details

The article was received on 13 Sep 2019, accepted on 07 Nov 2019 and first published on 08 Nov 2019


Article type: Paper
DOI: 10.1039/C9NR07905J
Nanoscale, 2019, Advance Article

  •   Request permissions

    Local scale structural changes of working OFET devices

    L. S. Grodd, E. Mikayelyan, T. Dane, U. Pietsch and S. Grigorian, Nanoscale, 2019, Advance Article , DOI: 10.1039/C9NR07905J

Search articles by author

Spotlight

Advertisements