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High-speed scanning ion conductance microscopy for sub-second topography imaging of live cells

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Abstract

Scanning ion conductance microscopy (SICM) is an emerging tool for non-invasive and high-resolution topography imaging of live cells. However, the imaging speed of conventional SICM setups is slow, requiring several seconds or even minutes per image, thereby making it difficult to study cellular dynamics. Here, we describe a high-speed SICM (HS-SICM) setup for topography imaging in the hopping mode with a pixel rate of 11.0 kHz, which is 15 times faster than what was reported before. In combination with a “turn step” procedure for rapid pipette retraction, we image the ultra-fast morphodynamics of live human platelets, A6 cells, and U2OS cells at a rate as fast as 0.6 s per frame. The results show that HS-SICM provides a useful platform for investigating the dynamics of cell morphology on a sub-second timescale.

Graphical abstract: High-speed scanning ion conductance microscopy for sub-second topography imaging of live cells

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Publication details

The article was received on 17 Dec 2018, accepted on 06 Apr 2019 and first published on 13 Apr 2019


Article type: Paper
DOI: 10.1039/C8NR10162K
Citation: Nanoscale, 2019, Advance Article

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    High-speed scanning ion conductance microscopy for sub-second topography imaging of live cells

    S. Simeonov and T. E. Schäffer, Nanoscale, 2019, Advance Article , DOI: 10.1039/C8NR10162K

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