Novel reference-free methods for the determination of the instrumental response of Laue-type bent crystal spectrometers

Abstract

We report on novel reference-free methods to determine the instrumental resolution of transmission-type bent crystal spectrometers. The novel methods are based on the measurements of a selected X-ray line in several orders of diffraction. It is shown that the angular broadening of the spectrometer and the natural linewidth of the selected transition can be obtained directly from the novel methods. No reference X-ray line or γ-ray line is needed. The precision of the results is about 10 times better than the one obtained with the standard method consisting of measuring a reference X-ray line and keeping fixed in the fit the natural width of this line at the value taken from available databases. The novel methods are illustrated for a DuMond-type bent crystal spectrometer with the Kα₁ X-ray line of Gd measured in the first five orders of diffraction.